Reference Type | Journal (article/letter/editorial) |
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Title | High-Resolution Electron Microscopy of the Tweed Microstructure in an Fe-Pd Alloy |
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Journal | Japanese Journal of Applied Physics |
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Authors | Muto, Shunsuke | Author |
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Takeda, Seiji | Author |
Oshima, Ryuichiro | Author |
Fujita, Francisco Eiichi | Author |
Year | 1988 (August 20) | Volume | 27 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.1143/jjap.27.l1387Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14992248 | Long-form Identifier | mindat:1:5:14992248:9 |
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GUID | 0 |
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Full Reference | Muto, Shunsuke, Takeda, Seiji, Oshima, Ryuichiro, Fujita, Francisco Eiichi (1988) High-Resolution Electron Microscopy of the Tweed Microstructure in an Fe-Pd Alloy. Japanese Journal of Applied Physics, 27. doi:10.1143/jjap.27.l1387 |
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Plain Text | Muto, Shunsuke, Takeda, Seiji, Oshima, Ryuichiro, Fujita, Francisco Eiichi (1988) High-Resolution Electron Microscopy of the Tweed Microstructure in an Fe-Pd Alloy. Japanese Journal of Applied Physics, 27. doi:10.1143/jjap.27.l1387 |
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In | (1988) Japanese Journal of Applied Physics Vol. 27. Japan Society of Applied Physics |
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