Reference Type | Journal (article/letter/editorial) |
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Title | In SituMonitoring of Surface Kinetics in GaAs Atomic Layer Epitaxy by Surface Photo-Absorption Method |
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Journal | Japanese Journal of Applied Physics |
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Authors | Koukitu, Akinori | Author |
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Ikeda, Hitoshi | Author |
Suzuki, Hiroshi | Author |
Seki, Hisashi | Author |
Year | 1991 (October 1) | Volume | 30 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.1143/jjap.30.l1712Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14996871 | Long-form Identifier | mindat:1:5:14996871:5 |
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GUID | 0 |
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Full Reference | Koukitu, Akinori, Ikeda, Hitoshi, Suzuki, Hiroshi, Seki, Hisashi (1991) In SituMonitoring of Surface Kinetics in GaAs Atomic Layer Epitaxy by Surface Photo-Absorption Method. Japanese Journal of Applied Physics, 30. doi:10.1143/jjap.30.l1712 |
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Plain Text | Koukitu, Akinori, Ikeda, Hitoshi, Suzuki, Hiroshi, Seki, Hisashi (1991) In SituMonitoring of Surface Kinetics in GaAs Atomic Layer Epitaxy by Surface Photo-Absorption Method. Japanese Journal of Applied Physics, 30. doi:10.1143/jjap.30.l1712 |
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In | (1991) Japanese Journal of Applied Physics Vol. 30. Japan Society of Applied Physics |
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