Koyama, Takahisa, Kagoshima, Yasushi, Wada, Izumi, Saikubo, Akihiko, Shimose, Kenichi, Hayashi, Kenji, Tsusaka, Yoshiyuki, Matsui, Junji (2004) High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope. Japanese Journal of Applied Physics, 43. doi:10.1143/jjap.43.l421
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope | ||
| Journal | Japanese Journal of Applied Physics | ||
| Authors | Koyama, Takahisa | Author | |
| Kagoshima, Yasushi | Author | ||
| Wada, Izumi | Author | ||
| Saikubo, Akihiko | Author | ||
| Shimose, Kenichi | Author | ||
| Hayashi, Kenji | Author | ||
| Tsusaka, Yoshiyuki | Author | ||
| Matsui, Junji | Author | ||
| Year | 2004 (March 5) | Volume | 43 |
| Publisher | Japan Society of Applied Physics | ||
| DOI | doi:10.1143/jjap.43.l421Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15022087 | Long-form Identifier | mindat:1:5:15022087:1 |
| GUID | 0 | ||
| Full Reference | Koyama, Takahisa, Kagoshima, Yasushi, Wada, Izumi, Saikubo, Akihiko, Shimose, Kenichi, Hayashi, Kenji, Tsusaka, Yoshiyuki, Matsui, Junji (2004) High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope. Japanese Journal of Applied Physics, 43. doi:10.1143/jjap.43.l421 | ||
| Plain Text | Koyama, Takahisa, Kagoshima, Yasushi, Wada, Izumi, Saikubo, Akihiko, Shimose, Kenichi, Hayashi, Kenji, Tsusaka, Yoshiyuki, Matsui, Junji (2004) High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope. Japanese Journal of Applied Physics, 43. doi:10.1143/jjap.43.l421 | ||
| In | (2004) Japanese Journal of Applied Physics Vol. 43. Japan Society of Applied Physics | ||
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