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Takada, Takahiro, Kageyama, Keisuke (2005) Synthesis and Microwave Dielectric Properties of La2O3–xB2O3-Based Melt Mixtures for Low-Temperature Cofired Ceramics. Japanese Journal of Applied Physics, 44 (9) 6629-6635 doi:10.1143/jjap.44.6629

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Reference TypeJournal (article/letter/editorial)
TitleSynthesis and Microwave Dielectric Properties of La2O3–xB2O3-Based Melt Mixtures for Low-Temperature Cofired Ceramics
JournalJapanese Journal of Applied Physics
AuthorsTakada, TakahiroAuthor
Kageyama, KeisukeAuthor
Year2005 (September 8)Volume44
Issue9
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.44.6629Search in ResearchGate
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Mindat Ref. ID15026329Long-form Identifiermindat:1:5:15026329:8
GUID0
Full ReferenceTakada, Takahiro, Kageyama, Keisuke (2005) Synthesis and Microwave Dielectric Properties of La2O3–xB2O3-Based Melt Mixtures for Low-Temperature Cofired Ceramics. Japanese Journal of Applied Physics, 44 (9) 6629-6635 doi:10.1143/jjap.44.6629
Plain TextTakada, Takahiro, Kageyama, Keisuke (2005) Synthesis and Microwave Dielectric Properties of La2O3–xB2O3-Based Melt Mixtures for Low-Temperature Cofired Ceramics. Japanese Journal of Applied Physics, 44 (9) 6629-6635 doi:10.1143/jjap.44.6629
In(2005, September) Japanese Journal of Applied Physics Vol. 44 (9) Japan Society of Applied Physics

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Takada, Takahiro, Yamamoto, Hirofumi, Kageyama, Keisuke (2003) Synthesis and Microwave Dielectric Properties ofxRe2O3-yB2O3(Re = La, Nd, Sm, Dy, Ho and Y) Compounds. Japanese Journal of Applied Physics, 42. 6162-6167 doi:10.1143/jjap.42.6162
Takahashi, Junichi, Kageyama, Keisuke, Kodaira, Kouhei (1993) Microwave Dielectric Properties of Lanthanide Titanate Ceramics. Japanese Journal of Applied Physics, 32. 4327-4331 doi:10.1143/jjap.32.4327
Takahashi, Junichi, Kageyama, Keisuke, Kiyono, Hajime, Nakano, Hiroshi, Itoh, Hidenobu (2005) Cation Substitution for BaTiO3Phase in Low-Fired Glass-Ceramics for Tunable Microwave Applications. Japanese Journal of Applied Physics, 44 (9) 7089-7093 doi:10.1143/jjap.44.7089
Yang, Aimin, Lin, Huixin, Luo, Lan, Chen, Wei (2006) Microwave Dielectric Properties of Low Temperature Cofired Glass-Ceramic Based on B2O3–La2O3–MgO–TiO2Glass with La(Mg0.5Ti0.5)O3Ceramics. Japanese Journal of Applied Physics, 45 (3) 1698-1701 doi:10.1143/jjap.45.1698
Cheng, Ching-Tai, Lin, Jiang-Tsair (2005) Densification Kinetics and Electrical Properties of Buried Resistors in Low-Temperature Cofired Ceramics. Japanese Journal of Applied Physics, 44 (1) 309-315 doi:10.1143/jjap.44.309
Fujii Hayashi, Sachiko, Nakamura, Takanori, Kageyama, Keisuke, Takagi, Hiroshi (2010) Monolithic Thermoelectric Devices Prepared with Multilayer Cofired Ceramics Technology. Japanese Journal of Applied Physics, 49 (9) 96505 doi:10.1143/jjap.49.096505
Kan, Akinori, Moriyama, Tohru, Takahashi, Susumu, Ogawa, Hirotaka (2012) Microwave Dielectric Properties of LiF- and CaTiO$_{3}$-Added MgO with Low Dielectric Loss and Near-Zero Temperature Coefficient of Resonant Frequency for Low-Temperature Cofired-Ceramic. Japanese Journal of Applied Physics, 51. 9 doi:10.1143/jjap.51.09lf01
Lee, Hong Ryul, Lee, Byoung Duk, Yoon, Ki Hyun (2005) Microstructures and Dielectric Properties of Low Temperature Cofired BiNbO4–ZnNb2O6Ceramics with Ag-Electrode. Japanese Journal of Applied Physics, 44 (3) 1333-1336 doi:10.1143/jjap.44.1333
Chen, Xiaoyan, Zhao, Xiangyu, Luo, Lan, Chen, Wei (2008) Effects of CaO–B2O3Glass on Sintering and Microwave Properties of Cordierite Ceramics for Low-Temperature Cofired Ceramics. Japanese Journal of Applied Physics, 47 (5) 3572-3575 doi:10.1143/jjap.47.3572
Kan, Akinori, Moriyama, Tohru, Takahashi, Susumu, Ogawa, Hirotaka (2012) Microwave Dielectric Properties of LiF- and CaTiO3-Added MgO with Low Dielectric Loss and Near-Zero Temperature Coefficient of Resonant Frequency for Low-Temperature Cofired-Ceramic. Japanese Journal of Applied Physics, 51 (9) 9 doi:10.7567/jjap.51.09lf01
Jao, Jui-Chu, Lin, Pang (2006) Method of Estimating Dielectric Properties of Dielectric Layers in Low-Temperature-Cofired Ceramic Devices. Japanese Journal of Applied Physics, 45 (11) 8751-8754 doi:10.1143/jjap.45.8751
 
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