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Shin, Dong-Soo (2006) Reduction in Escape Times of Photogenerated Charge Carriers with Asymmetric Intrastep Quantum Wells and Subsequent Improvement in Saturation Optical Intensity. Japanese Journal of Applied Physics, 45 (12) 9063-9065 doi:10.1143/jjap.45.9063

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Reference TypeJournal (article/letter/editorial)
TitleReduction in Escape Times of Photogenerated Charge Carriers with Asymmetric Intrastep Quantum Wells and Subsequent Improvement in Saturation Optical Intensity
JournalJapanese Journal of Applied Physics
AuthorsShin, Dong-SooAuthor
Year2006 (December 7)Volume45
Issue12
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.45.9063Search in ResearchGate
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Mindat Ref. ID15027312Long-form Identifiermindat:1:5:15027312:9
GUID0
Full ReferenceShin, Dong-Soo (2006) Reduction in Escape Times of Photogenerated Charge Carriers with Asymmetric Intrastep Quantum Wells and Subsequent Improvement in Saturation Optical Intensity. Japanese Journal of Applied Physics, 45 (12) 9063-9065 doi:10.1143/jjap.45.9063
Plain TextShin, Dong-Soo (2006) Reduction in Escape Times of Photogenerated Charge Carriers with Asymmetric Intrastep Quantum Wells and Subsequent Improvement in Saturation Optical Intensity. Japanese Journal of Applied Physics, 45 (12) 9063-9065 doi:10.1143/jjap.45.9063
In(2006, December) Japanese Journal of Applied Physics Vol. 45 (12) Japan Society of Applied Physics


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