Watabe, Ken-ichi, Hartnett, John G., Locke, Clayton R., Santarelli, Giorgio, Yanagimachi, Shinya, Shimazaki, Takeshi, Ikegami, Takeshi, Ohshima, Shin-ichi (2006) Short Term Frequency Stability Tests of Two Cryogenic Sapphire Oscillators. Japanese Journal of Applied Physics, 45 (12) 9234-9237 doi:10.1143/jjap.45.9234
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Short Term Frequency Stability Tests of Two Cryogenic Sapphire Oscillators | ||
| Journal | Japanese Journal of Applied Physics | ||
| Authors | Watabe, Ken-ichi | Author | |
| Hartnett, John G. | Author | ||
| Locke, Clayton R. | Author | ||
| Santarelli, Giorgio | Author | ||
| Yanagimachi, Shinya | Author | ||
| Shimazaki, Takeshi | Author | ||
| Ikegami, Takeshi | Author | ||
| Ohshima, Shin-ichi | Author | ||
| Year | 2006 (December 7) | Volume | 45 |
| Issue | 12 | ||
| Publisher | Japan Society of Applied Physics | ||
| DOI | doi:10.1143/jjap.45.9234Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15027351 | Long-form Identifier | mindat:1:5:15027351:8 |
| GUID | 0 | ||
| Full Reference | Watabe, Ken-ichi, Hartnett, John G., Locke, Clayton R., Santarelli, Giorgio, Yanagimachi, Shinya, Shimazaki, Takeshi, Ikegami, Takeshi, Ohshima, Shin-ichi (2006) Short Term Frequency Stability Tests of Two Cryogenic Sapphire Oscillators. Japanese Journal of Applied Physics, 45 (12) 9234-9237 doi:10.1143/jjap.45.9234 | ||
| Plain Text | Watabe, Ken-ichi, Hartnett, John G., Locke, Clayton R., Santarelli, Giorgio, Yanagimachi, Shinya, Shimazaki, Takeshi, Ikegami, Takeshi, Ohshima, Shin-ichi (2006) Short Term Frequency Stability Tests of Two Cryogenic Sapphire Oscillators. Japanese Journal of Applied Physics, 45 (12) 9234-9237 doi:10.1143/jjap.45.9234 | ||
| In | (2006, December) Japanese Journal of Applied Physics Vol. 45 (12) Japan Society of Applied Physics | ||
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