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Yasutake, Masatoshi, Watanabe, Kazutoshi, Wakiyama, Sigeru, Yamaoka, Takehiro (2006) Critical Dimension Measurement Using New Scanning Mode and Aligned Carbon Nanotube Scanning Probe Microscope Tip. Japanese Journal of Applied Physics, 45 (3) 1970-1973 doi:10.1143/jjap.45.1970

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Reference TypeJournal (article/letter/editorial)
TitleCritical Dimension Measurement Using New Scanning Mode and Aligned Carbon Nanotube Scanning Probe Microscope Tip
JournalJapanese Journal of Applied Physics
AuthorsYasutake, MasatoshiAuthor
Watanabe, KazutoshiAuthor
Wakiyama, SigeruAuthor
Yamaoka, TakehiroAuthor
Year2006 (March 27)Volume45
Issue3
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.45.1970Search in ResearchGate
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Mindat Ref. ID15027650Long-form Identifiermindat:1:5:15027650:2
GUID0
Full ReferenceYasutake, Masatoshi, Watanabe, Kazutoshi, Wakiyama, Sigeru, Yamaoka, Takehiro (2006) Critical Dimension Measurement Using New Scanning Mode and Aligned Carbon Nanotube Scanning Probe Microscope Tip. Japanese Journal of Applied Physics, 45 (3) 1970-1973 doi:10.1143/jjap.45.1970
Plain TextYasutake, Masatoshi, Watanabe, Kazutoshi, Wakiyama, Sigeru, Yamaoka, Takehiro (2006) Critical Dimension Measurement Using New Scanning Mode and Aligned Carbon Nanotube Scanning Probe Microscope Tip. Japanese Journal of Applied Physics, 45 (3) 1970-1973 doi:10.1143/jjap.45.1970
In(2006, March) Japanese Journal of Applied Physics Vol. 45 (3) Japan Society of Applied Physics

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Akita, Seiji, Nakayama, Yoshikazu (2004) Scanning Probe Microscope Tip with Carbon Nanotube Truss. Japanese Journal of Applied Physics, 43 (7) 4499-4501 doi:10.1143/jjap.43.4499
Yasutake, Masatoshi, Yamaoka, Takehiro, Nagatani, Yasunori (1996) Instrumentation of the High-Vacuum Atomic Force Microscope. Japanese Journal of Applied Physics, 35. 3783-3786 doi:10.1143/jjap.35.3783
Murayama, Ken, Gonda, Satoshi, Koyanagi, Hajime, Terasawa, Tsuneo, Hosaka, Sumio (2006) Critical-Dimension Measurement using Multi-Angle-Scanning Method in Atomic Force Microscope. Japanese Journal of Applied Physics, 45 (7) 5928-5932 doi:10.1143/jjap.45.5928
Okazaki, Ai, Akita, Seiji, Nakayama, Yoshikazu (2002) Scanning Probe Microscope Lithography of Silicon Using a Combination of a Carbon Nanotube Tip and a Polysilane Film as a Mask. Japanese Journal of Applied Physics, 41. 4973-4975 doi:10.1143/jjap.41.4973
Mizutani, Wataru, Choi, Nami, Uchihashi, Takayuki, Tokumoto, Hiroshi (2001) Carbon Nanotube Tip for Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 40. 4328-4330 doi:10.1143/jjap.40.4328
Tokumoto, Hiroshi, Bando, Hiroshi, Mizutani, Wataru, Okano, Makoto, Ono, Masatoshi, Murakami, Hiroshi, Okayama, Shigeo, Ono, Yuichi, Watanabe, Kazutoshi, Wakiyama, Shigeru, Sakai, Fumiki, Endo, Kazuhiro, Kajimura, Koji (1986) Observation of Atomic Image of 2H-NbSe2Surface by Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 25. doi:10.1143/jjap.25.l621
Nagase, Masao, Namatsu, Hideo, Kurihara, Kenji, Makino, Takahiro (1996) Critical Dimension Measurement in Nanometer Scale by Using Scanning Probe Microscopy. Japanese Journal of Applied Physics, 35. 4166-4174 doi:10.1143/jjap.35.4166
Yamaoka, Takehiro, Watanabe, Kazutoshi, Shirakawabe, Yoshiharu, Chinone, Kazuo, Saitoh, Eiji, Miyajima, Hideki (2006) Observations of Single Magnetic Domain Wall in Nanomagnet by Magnetic Force Microscopy. Japanese Journal of Applied Physics, 45 (3) 2230-2233 doi:10.1143/jjap.45.2230
Takezaki, Taiichi, Yagisawa, Daiki, Sueoka, Kazuhisa (2006) Magnetic Field Measurement using Scanning Magnetoresistance Microscope with Spin-Valve Sensor. Japanese Journal of Applied Physics, 45 (3) 2251-2254 doi:10.1143/jjap.45.2251
Akita, Seiji, Nakayama, Yoshikazu (2002) Manipulation of Nanomaterial by Carbon Nanotube Nanotweezers in Scanning Probe Microscope. Japanese Journal of Applied Physics, 41. 4242-4245 doi:10.1143/jjap.41.4242
Akita, Seiji, Nakayama, Yoshikazu (2003) Extraction of Inner Shell from Multiwall Carbon Nanotubes for Scanning Probe Microscope Tip. Japanese Journal of Applied Physics, 42. 3933-3936 doi:10.1143/jjap.42.3933
 
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