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Goh, Eunice Shing Mei, Chen, Tu Pei, Sun, Chang Qing, Ding, Liang, Liu, Yang (2009) Design of a Near-Perfect Anti Reflective Layer for Si Photodetectors Based on a SiO2Film Embedded with Si Nanocrystals. Japanese Journal of Applied Physics, 48 (6) 60206 doi:10.1143/jjap.48.060206

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Reference TypeJournal (article/letter/editorial)
TitleDesign of a Near-Perfect Anti Reflective Layer for Si Photodetectors Based on a SiO2Film Embedded with Si Nanocrystals
JournalJapanese Journal of Applied Physics
AuthorsGoh, Eunice Shing MeiAuthor
Chen, Tu PeiAuthor
Sun, Chang QingAuthor
Ding, LiangAuthor
Liu, YangAuthor
Year2009 (June 5)Volume48
Issue6
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.48.060206Search in ResearchGate
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Mindat Ref. ID15033846Long-form Identifiermindat:1:5:15033846:0
GUID0
Full ReferenceGoh, Eunice Shing Mei, Chen, Tu Pei, Sun, Chang Qing, Ding, Liang, Liu, Yang (2009) Design of a Near-Perfect Anti Reflective Layer for Si Photodetectors Based on a SiO2Film Embedded with Si Nanocrystals. Japanese Journal of Applied Physics, 48 (6) 60206 doi:10.1143/jjap.48.060206
Plain TextGoh, Eunice Shing Mei, Chen, Tu Pei, Sun, Chang Qing, Ding, Liang, Liu, Yang (2009) Design of a Near-Perfect Anti Reflective Layer for Si Photodetectors Based on a SiO2Film Embedded with Si Nanocrystals. Japanese Journal of Applied Physics, 48 (6) 60206 doi:10.1143/jjap.48.060206
In(2009, June) Japanese Journal of Applied Physics Vol. 48 (6) Japan Society of Applied Physics

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