Matsuda, Keiko, Watanabe, Takeshi, Sakaguchi, Koichi, Yoshikawa, Masanobu, Doi, Takuya, Masuda, Atsushi (2012) Microscopic Degradation Mechanisms in Silicon Photovoltaic Module under Long-Term Environmental Exposure. Japanese Journal of Applied Physics, 51. 10 doi:10.1143/jjap.51.10nf07
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Microscopic Degradation Mechanisms in Silicon Photovoltaic Module under Long-Term Environmental Exposure | ||
| Journal | Japanese Journal of Applied Physics | ||
| Authors | Matsuda, Keiko | Author | |
| Watanabe, Takeshi | Author | ||
| Sakaguchi, Koichi | Author | ||
| Yoshikawa, Masanobu | Author | ||
| Doi, Takuya | Author | ||
| Masuda, Atsushi | Author | ||
| Year | 2012 (October 22) | Volume | 51 |
| Publisher | Japan Society of Applied Physics | ||
| DOI | doi:10.1143/jjap.51.10nf07Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15041207 | Long-form Identifier | mindat:1:5:15041207:8 |
| GUID | 0 | ||
| Full Reference | Matsuda, Keiko, Watanabe, Takeshi, Sakaguchi, Koichi, Yoshikawa, Masanobu, Doi, Takuya, Masuda, Atsushi (2012) Microscopic Degradation Mechanisms in Silicon Photovoltaic Module under Long-Term Environmental Exposure. Japanese Journal of Applied Physics, 51. 10 doi:10.1143/jjap.51.10nf07 | ||
| Plain Text | Matsuda, Keiko, Watanabe, Takeshi, Sakaguchi, Koichi, Yoshikawa, Masanobu, Doi, Takuya, Masuda, Atsushi (2012) Microscopic Degradation Mechanisms in Silicon Photovoltaic Module under Long-Term Environmental Exposure. Japanese Journal of Applied Physics, 51. 10 doi:10.1143/jjap.51.10nf07 | ||
| In | (2012) Japanese Journal of Applied Physics Vol. 51. Japan Society of Applied Physics | ||
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