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Naritsuka, Shigeya, Mori, Midori, Takeuchi, Yoshitaka, Monno, Yohei, Maruyama, Takahiro (2012) X-ray Photoemission Spectroscopy Study of Low-Temperature Nitridation of GaAs(001) Surface Using RF Radical Source. Japanese Journal of Applied Physics, 51 (1) 15602 doi:10.1143/jjap.51.015602

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Reference TypeJournal (article/letter/editorial)
TitleX-ray Photoemission Spectroscopy Study of Low-Temperature Nitridation of GaAs(001) Surface Using RF Radical Source
JournalJapanese Journal of Applied Physics
AuthorsNaritsuka, ShigeyaAuthor
Mori, MidoriAuthor
Takeuchi, YoshitakaAuthor
Monno, YoheiAuthor
Maruyama, TakahiroAuthor
Year2012 (January)Volume51
Issue1
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.51.015602Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15041429Long-form Identifiermindat:1:5:15041429:4
GUID0
Full ReferenceNaritsuka, Shigeya, Mori, Midori, Takeuchi, Yoshitaka, Monno, Yohei, Maruyama, Takahiro (2012) X-ray Photoemission Spectroscopy Study of Low-Temperature Nitridation of GaAs(001) Surface Using RF Radical Source. Japanese Journal of Applied Physics, 51 (1) 15602 doi:10.1143/jjap.51.015602
Plain TextNaritsuka, Shigeya, Mori, Midori, Takeuchi, Yoshitaka, Monno, Yohei, Maruyama, Takahiro (2012) X-ray Photoemission Spectroscopy Study of Low-Temperature Nitridation of GaAs(001) Surface Using RF Radical Source. Japanese Journal of Applied Physics, 51 (1) 15602 doi:10.1143/jjap.51.015602
In(2012, January) Japanese Journal of Applied Physics Vol. 51 (1) Japan Society of Applied Physics


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