Naritsuka, Shigeya, Mori, Midori, Takeuchi, Yoshitaka, Monno, Yohei, Maruyama, Takahiro (2012) X-ray Photoemission Spectroscopy Study of Low-Temperature Nitridation of GaAs(001) Surface Using RF Radical Source. Japanese Journal of Applied Physics, 51 (1) 15602 doi:10.1143/jjap.51.015602
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | X-ray Photoemission Spectroscopy Study of Low-Temperature Nitridation of GaAs(001) Surface Using RF Radical Source | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Naritsuka, Shigeya | Author | |
Mori, Midori | Author | ||
Takeuchi, Yoshitaka | Author | ||
Monno, Yohei | Author | ||
Maruyama, Takahiro | Author | ||
Year | 2012 (January) | Volume | 51 |
Issue | 1 | ||
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.1143/jjap.51.015602Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15041429 | Long-form Identifier | mindat:1:5:15041429:4 |
GUID | 0 | ||
Full Reference | Naritsuka, Shigeya, Mori, Midori, Takeuchi, Yoshitaka, Monno, Yohei, Maruyama, Takahiro (2012) X-ray Photoemission Spectroscopy Study of Low-Temperature Nitridation of GaAs(001) Surface Using RF Radical Source. Japanese Journal of Applied Physics, 51 (1) 15602 doi:10.1143/jjap.51.015602 | ||
Plain Text | Naritsuka, Shigeya, Mori, Midori, Takeuchi, Yoshitaka, Monno, Yohei, Maruyama, Takahiro (2012) X-ray Photoemission Spectroscopy Study of Low-Temperature Nitridation of GaAs(001) Surface Using RF Radical Source. Japanese Journal of Applied Physics, 51 (1) 15602 doi:10.1143/jjap.51.015602 | ||
In | (2012, January) Japanese Journal of Applied Physics Vol. 51 (1) Japan Society of Applied Physics |
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