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Ochi, Yoshihiro, Terakawa, Kota, Hasegawa, Noboru, Yamamoto, Minoru, Tomita, Takuro, Kawachi, Tetsuya, Minami, Yasuo, Nishikino, Masaharu, Imazono, Takashi, Ishino, Masahiko, Suemoto, Tohru (2012) Picosecond Soft-X-ray Laser Interferometer for Probing Nanometer Surface Structure. Japanese Journal of Applied Physics, 51 (1) 16601 doi:10.1143/jjap.51.016601

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Reference TypeJournal (article/letter/editorial)
TitlePicosecond Soft-X-ray Laser Interferometer for Probing Nanometer Surface Structure
JournalJapanese Journal of Applied Physics
AuthorsOchi, YoshihiroAuthor
Terakawa, KotaAuthor
Hasegawa, NoboruAuthor
Yamamoto, MinoruAuthor
Tomita, TakuroAuthor
Kawachi, TetsuyaAuthor
Minami, YasuoAuthor
Nishikino, MasaharuAuthor
Imazono, TakashiAuthor
Ishino, MasahikoAuthor
Suemoto, TohruAuthor
Year2012 (January)Volume51
Issue1
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.51.016601Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15041445Long-form Identifiermindat:1:5:15041445:4
GUID0
Full ReferenceOchi, Yoshihiro, Terakawa, Kota, Hasegawa, Noboru, Yamamoto, Minoru, Tomita, Takuro, Kawachi, Tetsuya, Minami, Yasuo, Nishikino, Masaharu, Imazono, Takashi, Ishino, Masahiko, Suemoto, Tohru (2012) Picosecond Soft-X-ray Laser Interferometer for Probing Nanometer Surface Structure. Japanese Journal of Applied Physics, 51 (1) 16601 doi:10.1143/jjap.51.016601
Plain TextOchi, Yoshihiro, Terakawa, Kota, Hasegawa, Noboru, Yamamoto, Minoru, Tomita, Takuro, Kawachi, Tetsuya, Minami, Yasuo, Nishikino, Masaharu, Imazono, Takashi, Ishino, Masahiko, Suemoto, Tohru (2012) Picosecond Soft-X-ray Laser Interferometer for Probing Nanometer Surface Structure. Japanese Journal of Applied Physics, 51 (1) 16601 doi:10.1143/jjap.51.016601
In(2012, January) Japanese Journal of Applied Physics Vol. 51 (1) Japan Society of Applied Physics

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