Yoshida, Shotaro, Ikeyama, Kazuki, Yasuda, Toshiki, Furuta, Takashi, Takeuchi, Tetsuya, Iwaya, Motoaki, Kamiyama, Satoshi, Akasaki, Isamu (2016) Electron and hole accumulations at GaN/AlInN/GaN interfaces and conductive n-type AlInN/GaN distributed Bragg reflectors. Japanese Journal of Applied Physics, 55 (5) 5 doi:10.7567/jjap.55.05fd10
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Electron and hole accumulations at GaN/AlInN/GaN interfaces and conductive n-type AlInN/GaN distributed Bragg reflectors | ||
Journal | Japanese Journal of Applied Physics | ||
Authors | Yoshida, Shotaro | Author | |
Ikeyama, Kazuki | Author | ||
Yasuda, Toshiki | Author | ||
Furuta, Takashi | Author | ||
Takeuchi, Tetsuya | Author | ||
Iwaya, Motoaki | Author | ||
Kamiyama, Satoshi | Author | ||
Akasaki, Isamu | Author | ||
Year | 2016 (May 1) | Volume | 55 |
Issue | 5 | ||
Publisher | Japan Society of Applied Physics | ||
DOI | doi:10.7567/jjap.55.05fd10Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15046340 | Long-form Identifier | mindat:1:5:15046340:7 |
GUID | 0 | ||
Full Reference | Yoshida, Shotaro, Ikeyama, Kazuki, Yasuda, Toshiki, Furuta, Takashi, Takeuchi, Tetsuya, Iwaya, Motoaki, Kamiyama, Satoshi, Akasaki, Isamu (2016) Electron and hole accumulations at GaN/AlInN/GaN interfaces and conductive n-type AlInN/GaN distributed Bragg reflectors. Japanese Journal of Applied Physics, 55 (5) 5 doi:10.7567/jjap.55.05fd10 | ||
Plain Text | Yoshida, Shotaro, Ikeyama, Kazuki, Yasuda, Toshiki, Furuta, Takashi, Takeuchi, Tetsuya, Iwaya, Motoaki, Kamiyama, Satoshi, Akasaki, Isamu (2016) Electron and hole accumulations at GaN/AlInN/GaN interfaces and conductive n-type AlInN/GaN distributed Bragg reflectors. Japanese Journal of Applied Physics, 55 (5) 5 doi:10.7567/jjap.55.05fd10 | ||
In | (2016, May) Japanese Journal of Applied Physics Vol. 55 (5) Japan Society of Applied Physics |
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