Winston, Philip, Blumen, Robert (2022) Paul Butcher on Fuzz Testing. IEEE Software, 39 (1) 118-120 doi:10.1109/ms.2021.3118906
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Paul Butcher on Fuzz Testing | ||
Journal | IEEE Software | ||
Authors | Winston, Philip | Author | |
Blumen, Robert | Author | ||
Year | 2022 (January) | Volume | 39 |
Issue | 1 | ||
Publisher | Institute of Electrical and Electronics Engineers (IEEE) | ||
DOI | doi:10.1109/ms.2021.3118906Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15424098 | Long-form Identifier | mindat:1:5:15424098:1 |
GUID | 0 | ||
Full Reference | Winston, Philip, Blumen, Robert (2022) Paul Butcher on Fuzz Testing. IEEE Software, 39 (1) 118-120 doi:10.1109/ms.2021.3118906 | ||
Plain Text | Winston, Philip, Blumen, Robert (2022) Paul Butcher on Fuzz Testing. IEEE Software, 39 (1) 118-120 doi:10.1109/ms.2021.3118906 | ||
In | (2022, January) IEEE Software Vol. 39 (1) Institute of Electrical and Electronics Engineers (IEEE) |
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