De Luca, Claudio, Casu, Francesco, Manunta, Michele, Onorato, Giovanni, Lanari, Riccardo (2022) Comments on “Study of Systematic Bias in Measuring Surface Deformation With SAR Interferometry”. IEEE Transactions on Geoscience and Remote Sensing, 60. 1-5 doi:10.1109/tgrs.2021.3103037
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Comments on “Study of Systematic Bias in Measuring Surface Deformation With SAR Interferometry” | ||
Journal | IEEE Transactions on Geoscience and Remote Sensing | ||
Authors | De Luca, Claudio | Author | |
Casu, Francesco | Author | ||
Manunta, Michele | Author | ||
Onorato, Giovanni | Author | ||
Lanari, Riccardo | Author | ||
Year | 2022 | Volume | 60 |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) | ||
DOI | doi:10.1109/tgrs.2021.3103037Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15557639 | Long-form Identifier | mindat:1:5:15557639:3 |
GUID | 0 | ||
Full Reference | De Luca, Claudio, Casu, Francesco, Manunta, Michele, Onorato, Giovanni, Lanari, Riccardo (2022) Comments on “Study of Systematic Bias in Measuring Surface Deformation With SAR Interferometry”. IEEE Transactions on Geoscience and Remote Sensing, 60. 1-5 doi:10.1109/tgrs.2021.3103037 | ||
Plain Text | De Luca, Claudio, Casu, Francesco, Manunta, Michele, Onorato, Giovanni, Lanari, Riccardo (2022) Comments on “Study of Systematic Bias in Measuring Surface Deformation With SAR Interferometry”. IEEE Transactions on Geoscience and Remote Sensing, 60. 1-5 doi:10.1109/tgrs.2021.3103037 | ||
In | (2022) IEEE Transactions on Geoscience and Remote Sensing Vol. 60. Institute of Electrical and Electronics Engineers (IEEE) |
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