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Debrun, J. L. (1979) The Role of Charged Particle Activation for Materials Analysis. IEEE Transactions on Nuclear Science, 26 (2) 2229-2235 doi:10.1109/tns.1979.4329845

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Reference TypeJournal (article/letter/editorial)
TitleThe Role of Charged Particle Activation for Materials Analysis
JournalIEEE Transactions on Nuclear Science
AuthorsDebrun, J. L.Author
Year1979Volume26
Issue2
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tns.1979.4329845Search in ResearchGate
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Mindat Ref. ID15565440Long-form Identifiermindat:1:5:15565440:4
GUID0
Full ReferenceDebrun, J. L. (1979) The Role of Charged Particle Activation for Materials Analysis. IEEE Transactions on Nuclear Science, 26 (2) 2229-2235 doi:10.1109/tns.1979.4329845
Plain TextDebrun, J. L. (1979) The Role of Charged Particle Activation for Materials Analysis. IEEE Transactions on Nuclear Science, 26 (2) 2229-2235 doi:10.1109/tns.1979.4329845
In(1979, April) IEEE Transactions on Nuclear Science Vol. 26 (2) Institute of Electrical and Electronics Engineers (IEEE)

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Blondiaux, G., Giovagnoli, A., Koemmerer, C., Valladon, M., Debrun, J. L., Hallais, J., Huber, A. (1981) Characterization of Semiconductor Materials by Charged Particle Activation. IEEE Transactions on Nuclear Science, 28 (2) 1675-1678 doi:10.1109/tns.1981.4331497
Blondiaux, G., Giovagnoli, A., Valladon, M., Debrun, J. L., Barraud, J. Y. (1983) Studies on Polycrystalline Silicon for Solar Applications, including Characterization of Trace Elements B, C and Al by Charged Particles Activation Analysis. IEEE Transactions on Nuclear Science, 30 (2) 1619-1622 doi:10.1109/tns.1983.4332599
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