| Reference Type | Journal (article/letter/editorial) |
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| Title | High Intensity Beam Profile Monitors for the LAMPF Primary Beam Lines |
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| Journal | IEEE Transactions on Nuclear Science |
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| Authors | Hoffman, E. W. | Author |
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| Macek, R. J. | Author |
| van Dyck, O. | Author |
| Lee, D. | Author |
| Harvey, A. | Author |
| Bridge, J. | Author |
| Caine, J. | Author |
| Year | 1979 (June) | Volume | 26 |
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| Issue | 3 |
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| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
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| DOI | doi:10.1109/tns.1979.4330056Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 15565711 | Long-form Identifier | mindat:1:5:15565711:5 |
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|
| GUID | 0 |
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| Full Reference | Hoffman, E. W., Macek, R. J., van Dyck, O., Lee, D., Harvey, A., Bridge, J., Caine, J. (1979) High Intensity Beam Profile Monitors for the LAMPF Primary Beam Lines. IEEE Transactions on Nuclear Science, 26 (3) 3420-3422 doi:10.1109/tns.1979.4330056 |
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| Plain Text | Hoffman, E. W., Macek, R. J., van Dyck, O., Lee, D., Harvey, A., Bridge, J., Caine, J. (1979) High Intensity Beam Profile Monitors for the LAMPF Primary Beam Lines. IEEE Transactions on Nuclear Science, 26 (3) 3420-3422 doi:10.1109/tns.1979.4330056 |
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| In | (1979, June) IEEE Transactions on Nuclear Science Vol. 26 (3) Institute of Electrical and Electronics Engineers (IEEE) |
|---|
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