Reference Type | Journal (article/letter/editorial) |
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Title | Analysis of Time-Dependent Radiation-Induced Conductivity in Dielectrics and Effect on Cable SGEMP |
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Journal | IEEE Transactions on Nuclear Science |
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Authors | Shaeffer, D. Lynn | Author |
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Siegel, Joel M. | Author |
Year | 1982 (December) | Volume | 29 |
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Issue | 6 |
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Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
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DOI | doi:10.1109/tns.1982.4336441Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 15568045 | Long-form Identifier | mindat:1:5:15568045:8 |
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GUID | 0 |
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Full Reference | Shaeffer, D. Lynn, Siegel, Joel M. (1982) Analysis of Time-Dependent Radiation-Induced Conductivity in Dielectrics and Effect on Cable SGEMP. IEEE Transactions on Nuclear Science, 29 (6) 1745-1753 doi:10.1109/tns.1982.4336441 |
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Plain Text | Shaeffer, D. Lynn, Siegel, Joel M. (1982) Analysis of Time-Dependent Radiation-Induced Conductivity in Dielectrics and Effect on Cable SGEMP. IEEE Transactions on Nuclear Science, 29 (6) 1745-1753 doi:10.1109/tns.1982.4336441 |
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In | (1982, December) IEEE Transactions on Nuclear Science Vol. 29 (6) Institute of Electrical and Electronics Engineers (IEEE) |
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