Chupp, W., Faltens, A., Hartwig, E. C., Keefe, D., Kim, C. H., Laslett, L. J., Nemetz, R., Pike, C., Rosenblum, S. S., Shiloh, J., Smith, L., Tiefenback, M., Vanecek, D. (1983) A Quadrupole Beam Transport Experiment for Heavy Ions under Extreme Space Charge Conditions. IEEE Transactions on Nuclear Science, 30 (4) 2549-2551 doi:10.1109/tns.1983.4332877
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | A Quadrupole Beam Transport Experiment for Heavy Ions under Extreme Space Charge Conditions | ||
Journal | IEEE Transactions on Nuclear Science | ||
Authors | Chupp, W. | Author | |
Faltens, A. | Author | ||
Hartwig, E. C. | Author | ||
Keefe, D. | Author | ||
Kim, C. H. | Author | ||
Laslett, L. J. | Author | ||
Nemetz, R. | Author | ||
Pike, C. | Author | ||
Rosenblum, S. S. | Author | ||
Shiloh, J. | Author | ||
Smith, L. | Author | ||
Tiefenback, M. | Author | ||
Vanecek, D. | Author | ||
Year | 1983 (August) | Volume | 30 |
Issue | 4 | ||
Publisher | Institute of Electrical and Electronics Engineers (IEEE) | ||
DOI | doi:10.1109/tns.1983.4332877Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15568964 | Long-form Identifier | mindat:1:5:15568964:2 |
GUID | 0 | ||
Full Reference | Chupp, W., Faltens, A., Hartwig, E. C., Keefe, D., Kim, C. H., Laslett, L. J., Nemetz, R., Pike, C., Rosenblum, S. S., Shiloh, J., Smith, L., Tiefenback, M., Vanecek, D. (1983) A Quadrupole Beam Transport Experiment for Heavy Ions under Extreme Space Charge Conditions. IEEE Transactions on Nuclear Science, 30 (4) 2549-2551 doi:10.1109/tns.1983.4332877 | ||
Plain Text | Chupp, W., Faltens, A., Hartwig, E. C., Keefe, D., Kim, C. H., Laslett, L. J., Nemetz, R., Pike, C., Rosenblum, S. S., Shiloh, J., Smith, L., Tiefenback, M., Vanecek, D. (1983) A Quadrupole Beam Transport Experiment for Heavy Ions under Extreme Space Charge Conditions. IEEE Transactions on Nuclear Science, 30 (4) 2549-2551 doi:10.1109/tns.1983.4332877 | ||
In | (1983, August) IEEE Transactions on Nuclear Science Vol. 30 (4) Institute of Electrical and Electronics Engineers (IEEE) |
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