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Anderson, W. T., Davis, G. E., Mateer, J. S., Lile, D. L. (1984) Ionizing Radiation Effects in InP MISFETs. IEEE Transactions on Nuclear Science, 31 (6) 1467-1470 doi:10.1109/tns.1984.4333531

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Reference TypeJournal (article/letter/editorial)
TitleIonizing Radiation Effects in InP MISFETs
JournalIEEE Transactions on Nuclear Science
AuthorsAnderson, W. T.Author
Davis, G. E.Author
Mateer, J. S.Author
Lile, D. L.Author
Year1984 (December)Volume31
Issue6
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tns.1984.4333531Search in ResearchGate
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Mindat Ref. ID15569717Long-form Identifiermindat:1:5:15569717:3
GUID0
Full ReferenceAnderson, W. T., Davis, G. E., Mateer, J. S., Lile, D. L. (1984) Ionizing Radiation Effects in InP MISFETs. IEEE Transactions on Nuclear Science, 31 (6) 1467-1470 doi:10.1109/tns.1984.4333531
Plain TextAnderson, W. T., Davis, G. E., Mateer, J. S., Lile, D. L. (1984) Ionizing Radiation Effects in InP MISFETs. IEEE Transactions on Nuclear Science, 31 (6) 1467-1470 doi:10.1109/tns.1984.4333531
In(1984) IEEE Transactions on Nuclear Science Vol. 31 (6) Institute of Electrical and Electronics Engineers (IEEE)

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Anderson, W. T., Boos, J. B. (1985) Radiation Effects in InP JFETs. IEEE Transactions on Nuclear Science, 32 (6) 4001-4004 doi:10.1109/tns.1985.4334058
Myers, D. K., Herzog, W., Phy, W., Coppage, F. (1984) Ionizing Radiation Effects on Copperclad Polyimide. IEEE Transactions on Nuclear Science, 31 (6) 1344-1347 doi:10.1109/tns.1984.4333508
Benedetto, J. M., Boesch, H. E. (1984) Mosfet and MOS Capacitor Responses to Ionizing Radiation. IEEE Transactions on Nuclear Science, 31 (6) 1461-1466 doi:10.1109/tns.1984.4333530
Mikawa, R. E., Lenahan, P. M. (1984) A Comparison of Ionizing Radiation and Hot Electron Effects in MOS Structures. IEEE Transactions on Nuclear Science, 31 (6) 1573-1575 doi:10.1109/tns.1984.4333553
Waterman, James R., Schiebel, R. A. (1987) Ionizing Radiation Effects in N-Channel (Hg,Cd) Te MISFETs with Anodic Sulfide Passivation. IEEE Transactions on Nuclear Science, 34 (6) 1597-1601 doi:10.1109/tns.1987.4337522
Kuhlmann, G. J., Grannemann, W. W. (1973) Ionizing Radiation Effects on GaAsP MIS Capacitor Structures. IEEE Transactions on Nuclear Science, 20 (6) 166-170 doi:10.1109/tns.1973.4327388
Davis, G. E., Hite, L. R., Blake, T. G. W., Chen, C.-E., Lam, H. W., DeMoyer, R. (1985) Transient Radiation Effects in SOI Memories. IEEE Transactions on Nuclear Science, 32 (6) 4431-4437 doi:10.1109/tns.1985.4334137
Neamen, D., Buchanan, B., Shedd, W. (1975) Ionizing Radiation Effects in SOS Structures. IEEE Transactions on Nuclear Science, 22 (6) 2197-2202 doi:10.1109/tns.1975.4328105
(1984) Summary of 1984 IEEE Annual Conference on Nuclear and Space Radiation Effects. IEEE Transactions on Nuclear Science, 31 (6) 1049 doi:10.1109/tns.1984.4333444
(1984) IEEE Nuclear and Plasma Sciences Committee Radiation Effects Committee. IEEE Transactions on Nuclear Science, 31 (6) 1054 doi:10.1109/tns.1984.4333448
(1984) IEEE Nuclear and Space Radiation Effects Conference Short Course. IEEE Transactions on Nuclear Science, 31 (6) 1050 doi:10.1109/tns.1984.4333445
 
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