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Fu, J. S., Weaver, H. T., Koga, R., Kolasinski, W. A. (1985) Comparison of 2D Memory SEU Transport Simulation with Experiments. IEEE Transactions on Nuclear Science, 32 (6) 4145-4149 doi:10.1109/tns.1985.4334083

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Reference TypeJournal (article/letter/editorial)
TitleComparison of 2D Memory SEU Transport Simulation with Experiments
JournalIEEE Transactions on Nuclear Science
AuthorsFu, J. S.Author
Weaver, H. T.Author
Koga, R.Author
Kolasinski, W. A.Author
Year1985Volume32
Issue6
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tns.1985.4334083Search in ResearchGate
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Mindat Ref. ID15570892Long-form Identifiermindat:1:5:15570892:3
GUID0
Full ReferenceFu, J. S., Weaver, H. T., Koga, R., Kolasinski, W. A. (1985) Comparison of 2D Memory SEU Transport Simulation with Experiments. IEEE Transactions on Nuclear Science, 32 (6) 4145-4149 doi:10.1109/tns.1985.4334083
Plain TextFu, J. S., Weaver, H. T., Koga, R., Kolasinski, W. A. (1985) Comparison of 2D Memory SEU Transport Simulation with Experiments. IEEE Transactions on Nuclear Science, 32 (6) 4145-4149 doi:10.1109/tns.1985.4334083
In(1985) IEEE Transactions on Nuclear Science Vol. 32 (6) Institute of Electrical and Electronics Engineers (IEEE)

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Koga, R., Kolasinski, W. A., Marra, M. T., Hanna, W. A. (1985) Techniques of Microprocessor Testing and SEU-Rate Prediction. IEEE Transactions on Nuclear Science, 32 (6) 4219-4224 doi:10.1109/tns.1985.4334098
Axness, C. L., Weaver, H. T., Fu, J. S., Koga, R., Kolasinski, W. A. (1986) Mechanisms Leading to Single Event Upset. IEEE Transactions on Nuclear Science, 33 (6) 1577-1580 doi:10.1109/tns.1986.4334644
Cusick, J., Koga, R., Kolasinski, W. A., King, C. (1985) SEU Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors. IEEE Transactions on Nuclear Science, 32 (6) 4206-4211 doi:10.1109/tns.1985.4334095
Weaver, H. T., Axness, C. L., McBrayer, J. D., Browning, J. S., Fu, J. S., Ochoa, A., Koga, R. (1987) An SEU Tolerant Memory Cell Derived from Fundamental Studies of SEU Mechanisms in SRAM. IEEE Transactions on Nuclear Science, 34 (6) 1281-1286 doi:10.1109/tns.1987.4337466
Fu, J. S., Lee, K. H., Koga, R., Kolanski, W. A., Weaver, H. T., Browning, J. S. (1987) Processing Enhanced SEU Tolerance in High Density SRAMs. IEEE Transactions on Nuclear Science, 34 (6) 1322-1325 doi:10.1109/tns.1987.4337473
Rollins, J. G., Kolasinski, W. A., Marvin, D. C., Koga, R. (1986) Numerical Simulation of SEU Induced Latch-Up. IEEE Transactions on Nuclear Science, 33 (6) 1565-1570 doi:10.1109/tns.1986.4334642
Koga, R., Kolasinski, W. A., Imamoto, S. (1985) Heavy Ion Induced Upsets in Semiconductor Devices. IEEE Transactions on Nuclear Science, 32 (1) 159-162 doi:10.1109/tns.1985.4336812
Browning, John S., Koga, R., Kolasinski, W. A. (1985) Single Event Upset Rate Estimates for a 16-K CMOS SRAM. IEEE Transactions on Nuclear Science, 32 (6) 4133-4139 doi:10.1109/tns.1985.4334081
Campbell, A. B., Stapor, W. J., Koga, R., Kolasinski, W. A. (1985) Correlated Proton and Heavy Ion Upset Measurements on IDT Static RAMs. IEEE Transactions on Nuclear Science, 32 (6) 4150-4154 doi:10.1109/tns.1985.4334084
Nichols, D. K., Smith, L. S., Price, W. E., Koga, R., Kolasinski, W. A. (1987) Recent Trends in Parts SEU Susceptibility from Heavy Ions. IEEE Transactions on Nuclear Science, 34 (6) 1332-1337 doi:10.1109/tns.1987.4337475
Brucker, G. J., Smeltzer, R., Kolasinski, W. A., Koga, R. (1984) Soft Error Dependence on Feature Size. IEEE Transactions on Nuclear Science, 31 (6) 1562-1564 doi:10.1109/tns.1984.4333549
 
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