Ying, Shih-Wei, Chao, Shou-Yen, Shih, Ming-Chang, Huang, Chien-Jung, Lan, Wen-How (2023) Thickness Study of Ga2O3 Barrier Layer in p-Si/n-MgZnO:Er/Ga2O3/ZnO:In Diode. Crystals, 13 (2) 275 doi:10.3390/cryst13020275
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Thickness Study of Ga2O3 Barrier Layer in p-Si/n-MgZnO:Er/Ga2O3/ZnO:In Diode | ||
Journal | Crystals | ||
Authors | Ying, Shih-Wei | Author | |
Chao, Shou-Yen | Author | ||
Shih, Ming-Chang | Author | ||
Huang, Chien-Jung | Author | ||
Lan, Wen-How | Author | ||
Year | 2023 (February 5) | Volume | 13 |
Issue | 2 | ||
Publisher | MDPI AG | ||
DOI | doi:10.3390/cryst13020275Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15698929 | Long-form Identifier | mindat:1:5:15698929:1 |
GUID | 0 | ||
Full Reference | Ying, Shih-Wei, Chao, Shou-Yen, Shih, Ming-Chang, Huang, Chien-Jung, Lan, Wen-How (2023) Thickness Study of Ga2O3 Barrier Layer in p-Si/n-MgZnO:Er/Ga2O3/ZnO:In Diode. Crystals, 13 (2) 275 doi:10.3390/cryst13020275 | ||
Plain Text | Ying, Shih-Wei, Chao, Shou-Yen, Shih, Ming-Chang, Huang, Chien-Jung, Lan, Wen-How (2023) Thickness Study of Ga2O3 Barrier Layer in p-Si/n-MgZnO:Er/Ga2O3/ZnO:In Diode. Crystals, 13 (2) 275 doi:10.3390/cryst13020275 | ||
In | (2023, January) Crystals Vol. 13 (2) MDPI AG |
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