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Mizginov, Dmitry, Telminov, Oleg, Yanovich, Sergey, Zhevnenko, Dmitry, Meshchaninov, Fedor, Gornev, Evgeny (2023) Investigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor. Crystals, 13 (2) 323 doi:10.3390/cryst13020323

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor
JournalCrystals
AuthorsMizginov, DmitryAuthor
Telminov, OlegAuthor
Yanovich, SergeyAuthor
Zhevnenko, DmitryAuthor
Meshchaninov, FedorAuthor
Gornev, EvgenyAuthor
Year2023 (February 15)Volume13
Issue2
PublisherMDPI AG
DOIdoi:10.3390/cryst13020323Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15707063Long-form Identifiermindat:1:5:15707063:9
GUID0
Full ReferenceMizginov, Dmitry, Telminov, Oleg, Yanovich, Sergey, Zhevnenko, Dmitry, Meshchaninov, Fedor, Gornev, Evgeny (2023) Investigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor. Crystals, 13 (2) 323 doi:10.3390/cryst13020323
Plain TextMizginov, Dmitry, Telminov, Oleg, Yanovich, Sergey, Zhevnenko, Dmitry, Meshchaninov, Fedor, Gornev, Evgeny (2023) Investigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor. Crystals, 13 (2) 323 doi:10.3390/cryst13020323
In(2023, January) Crystals Vol. 13 (2) MDPI AG


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