TAKIZAWA, Shigeru, OHNO, Yoshiki (1999) Sample Preparation for Observation with High Resolution Scanning Electron Microscope (HRSEM) by Ion-beam Sputter Coating. Journal of the Mineralogical Society of Japan, 28 (2) 65-69 doi:10.2465/gkk1952.28.65
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Sample Preparation for Observation with High Resolution Scanning Electron Microscope (HRSEM) by Ion-beam Sputter Coating. | ||
Journal | Journal of the Mineralogical Society of Japan | ||
Authors | TAKIZAWA, Shigeru | Author | |
OHNO, Yoshiki | Author | ||
Year | 1999 | Volume | 28 |
Issue | 2 | ||
Publisher | Japan Association of Mineralogical Sciences | ||
Download URL | https://www.jstage.jst.go.jp/article/gkk1952/28/2/28_2_65/_pdf/-char/ja/ | ||
DOI | doi:10.2465/gkk1952.28.65Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 162863 | Long-form Identifier | mindat:1:5:162863:4 |
GUID | 0 | ||
Full Reference | TAKIZAWA, Shigeru, OHNO, Yoshiki (1999) Sample Preparation for Observation with High Resolution Scanning Electron Microscope (HRSEM) by Ion-beam Sputter Coating. Journal of the Mineralogical Society of Japan, 28 (2) 65-69 doi:10.2465/gkk1952.28.65 | ||
Plain Text | TAKIZAWA, Shigeru, OHNO, Yoshiki (1999) Sample Preparation for Observation with High Resolution Scanning Electron Microscope (HRSEM) by Ion-beam Sputter Coating. Journal of the Mineralogical Society of Japan, 28 (2) 65-69 doi:10.2465/gkk1952.28.65 | ||
In | (1999) Journal of the Mineralogical Society of Japan Vol. 28 (2) Japan Association of Mineralogical Sciences |
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