Reference Type | Journal (article/letter/editorial) |
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Title | Observation of a sub-surface defect in sapphire by Rayleigh wave reflection in the scanning acoustic microscope |
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Journal | Journal of Materials Science Letters |
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Authors | Smith, G. C. | Author |
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Gee, M. G. | Author |
Year | 1986 (November) | Volume | 5 |
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Issue | 11 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/bf01742223Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 16409615 | Long-form Identifier | mindat:1:5:16409615:8 |
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GUID | 0 |
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Full Reference | Smith, G. C., Gee, M. G. (1986) Observation of a sub-surface defect in sapphire by Rayleigh wave reflection in the scanning acoustic microscope. Journal of Materials Science Letters, 5 (11) 1133-1134 doi:10.1007/bf01742223 |
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Plain Text | Smith, G. C., Gee, M. G. (1986) Observation of a sub-surface defect in sapphire by Rayleigh wave reflection in the scanning acoustic microscope. Journal of Materials Science Letters, 5 (11) 1133-1134 doi:10.1007/bf01742223 |
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In | (1986, November) Journal of Materials Science Letters Vol. 5 (11) Springer Science and Business Media LLC |
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