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Krakauer, B. W., Gau, J. S., Smith, D. J. (1986) Structural characterization of yttrium oxide thin films using transmission electron microscopy. Journal of Materials Science Letters, 5 (6) 667-670 doi:10.1007/bf01731545

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Reference TypeJournal (article/letter/editorial)
TitleStructural characterization of yttrium oxide thin films using transmission electron microscopy
JournalJournal of Materials Science Letters
AuthorsKrakauer, B. W.Author
Gau, J. S.Author
Smith, D. J.Author
Year1986 (June)Volume5
Issue6
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf01731545Search in ResearchGate
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Mindat Ref. ID16409857Long-form Identifiermindat:1:5:16409857:2
GUID0
Full ReferenceKrakauer, B. W., Gau, J. S., Smith, D. J. (1986) Structural characterization of yttrium oxide thin films using transmission electron microscopy. Journal of Materials Science Letters, 5 (6) 667-670 doi:10.1007/bf01731545
Plain TextKrakauer, B. W., Gau, J. S., Smith, D. J. (1986) Structural characterization of yttrium oxide thin films using transmission electron microscopy. Journal of Materials Science Letters, 5 (6) 667-670 doi:10.1007/bf01731545
In(1986, June) Journal of Materials Science Letters Vol. 5 (6) Springer Science and Business Media LLC

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Silva, E., Robinson, J. W., Northwood, D. O. (1986) Ion beam thinning of a zirconium alloy for transmission electron microscopy. Journal of Materials Science Letters, 5 (3) 343-346 doi:10.1007/bf01748100
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Chatfield, Ch., Haubner, R., Lux, B. (1989) Examination of thin films of low pressure diamond by transmission electron microscopy. Journal of Materials Science Letters, 8 (10) 1188-1192 doi:10.1007/bf01730066
Pearce, J. T. H. (1983) Examination of M7C3 carbides in high chromium cast irons using thin foil transmission electron microscopy. Journal of Materials Science Letters, 2 (8) 428-432 doi:10.1007/bf00723685
Born, P. J., Robertson, D. S., Smith, P. C. (1985) A study of phosphors in the yttrium oxide-silicon dioxide phase system. Journal of Materials Science Letters, 4 (5) 497-501 doi:10.1007/bf00720016
Sears, J. S. (1978) Transmission electron microscopy of dislocations in nickel oxide single crystals. Journal of Materials Science, 13. 2455-2461 doi:10.1007/bf00808061
 
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