Reference Type | Journal (article/letter/editorial) |
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Title | Temperature and annealing effects on the optical absorption edge of amorphous SiO/B2O3 thin films |
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Journal | Journal of Materials Science Letters |
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Authors | Islam, M. H. | Author |
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Hogarth, C. A. | Author |
Year | 1986 (July) | Volume | 5 |
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Issue | 7 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/bf01730209Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 16409896 | Long-form Identifier | mindat:1:5:16409896:1 |
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GUID | 0 |
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Full Reference | Islam, M. H., Hogarth, C. A. (1986) Temperature and annealing effects on the optical absorption edge of amorphous SiO/B2O3 thin films. Journal of Materials Science Letters, 5 (7) 681-684 doi:10.1007/bf01730209 |
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Plain Text | Islam, M. H., Hogarth, C. A. (1986) Temperature and annealing effects on the optical absorption edge of amorphous SiO/B2O3 thin films. Journal of Materials Science Letters, 5 (7) 681-684 doi:10.1007/bf01730209 |
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In | (1986, July) Journal of Materials Science Letters Vol. 5 (7) Springer Science and Business Media LLC |
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