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Kobayashi, K. (1995) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-GeO2 glasses Part V The effects of B2O3 content. Journal of Materials Science Letters, 14 (1) 6-8 doi:10.1007/bf02565268

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Reference TypeJournal (article/letter/editorial)
TitleOH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-GeO2 glasses Part V The effects of B2O3 content
JournalJournal of Materials Science Letters
AuthorsKobayashi, K.Author
Year1995 (January)Volume14
Issue1
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf02565268Search in ResearchGate
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Mindat Ref. ID16414557Long-form Identifiermindat:1:5:16414557:3
GUID0
Full ReferenceKobayashi, K. (1995) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-GeO2 glasses Part V The effects of B2O3 content. Journal of Materials Science Letters, 14 (1) 6-8 doi:10.1007/bf02565268
Plain TextKobayashi, K. (1995) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-GeO2 glasses Part V The effects of B2O3 content. Journal of Materials Science Letters, 14 (1) 6-8 doi:10.1007/bf02565268
In(1995, January) Journal of Materials Science Letters Vol. 14 (1) Springer Science and Business Media LLC

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Kobayashi, K. (1995) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-MgO glasses VII, the effects of MgO content. Journal of Materials Science Letters, 14 (10) doi:10.1007/bf00253379
Kobayashi, K. (1995) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-CaO glasses Part VI The effects of CaO content. Journal of Materials Science Letters, 14 (9) 626-628 doi:10.1007/bf00586160
Kobayashi, K., Mizushima, I. (1994) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-Al2O3 glasses Part III The effects of PbO content. Journal of Materials Science Letters, 13 (24) 1764-1766 doi:10.1007/bf00776350
Kobayashi, Keiji, Mizushima, Ichiro (1994) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbOî—¸B2O3î—¸SiO2î—¸GeO2 glasses. The effects of OH content. Journal of Non-Crystalline Solids, 180 (1) 84-87 doi:10.1016/0022-3093(94)90400-6
Kobayashi, K. (1994) OH-related capacitance-voltage recovery effect in metal-oxide-semiconductor capacitors passivated by ZnO-B2O3-P2O5-SiO2 glasses Part II The effects of P 2 O 5 content. Journal of Materials Science Letters, 13 (20) 1446-1447 doi:10.1007/bf00419130
Kobayashi, Keiji, Mizushima, Ichiro (1996) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by ZnO-B2O3-SiO2-P2O5 glasses part VIIIthe effects of SrF 2 and BeO contents. Journal of Materials Science Letters, 15 (4) 357-359 doi:10.1007/bf00591662
Kobayashi, Keiji (1995) OH-Related Capacitance-Voltage Recovery Effect in MOS Capacitors Passivated by Fluoride-Containing ZnO-B2O3-SiO2-P2O5 Glasses. Journal of Solid State Chemistry, 118. 212-214 doi:10.1006/jssc.1995.1335
Kobayashi, K. (1994) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by ZnO-B2OP3O-P2O5O-SiO2 glasses IV. The effects of BaO content. Journal of Materials Science Letters, 13 (21) 1533-1534 doi:10.1007/bf00626500
Kobayashi, K., Sasaki, H. (1994) OH-related capacitance-voltage recovery effect in metal-oxide semiconductor capacitors passivated by ZnO-B2O3-P2O5-SiO glasses. Journal of Materials Science Letters, 13 (17) 1254-1255 doi:10.1007/bf00270952
Kobayashi, Keiji (1997) Capacitance–voltage curve recovery of MOS capacitors passivated with BaF2–BeF2–SiO2 –B2O3–P2O5 glasses. Journal of Materials Chemistry, 7. 127-129 doi:10.1039/a602563c
Kobayashi, Keiji (1997) Improvement of polarizable capacitance—voltage curves of MOS capacitors passivated with BN-and PbF2-containing SiO2B2O3GeO2 glasses. Journal of Non-Crystalline Solids, 217 (2) 323-328 doi:10.1016/s0022-3093(97)00138-5
 
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