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Lee, C. R., Leem, J. Y., Chun, B. S. (1995) The AES and micro-raman characteristics of diamond thin films grown by EACVD as the nucleation free energy increases. Journal of Materials Science Letters, 14 (5) 361-365 doi:10.1007/bf00592150

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Reference TypeJournal (article/letter/editorial)
TitleThe AES and micro-raman characteristics of diamond thin films grown by EACVD as the nucleation free energy increases
JournalJournal of Materials Science Letters
AuthorsLee, C. R.Author
Leem, J. Y.Author
Chun, B. S.Author
Year1995Volume14
Issue5
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00592150Search in ResearchGate
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Mindat Ref. ID16415029Long-form Identifiermindat:1:5:16415029:4
GUID0
Full ReferenceLee, C. R., Leem, J. Y., Chun, B. S. (1995) The AES and micro-raman characteristics of diamond thin films grown by EACVD as the nucleation free energy increases. Journal of Materials Science Letters, 14 (5) 361-365 doi:10.1007/bf00592150
Plain TextLee, C. R., Leem, J. Y., Chun, B. S. (1995) The AES and micro-raman characteristics of diamond thin films grown by EACVD as the nucleation free energy increases. Journal of Materials Science Letters, 14 (5) 361-365 doi:10.1007/bf00592150
In(1995) Journal of Materials Science Letters Vol. 14 (5) Springer Science and Business Media LLC

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Lee, J. H., Kim, D. S., Lee, Y. H., Farouk, B. (1995) Effects of oxidation on optical properties of polymer-like and diamond-like amorphous hydrogenated carbon films. Journal of Materials Science Letters, 14 (16) 1132-1134 doi:10.1007/bf00423382
Ting, Wu, Badaya, M., Itti, R., Ishimaru, K., Morishita, T., Koshizuka, N., Tanaka, S. (1995) Surface electronic properties and morphology of as-grown c-axis orientated Y1Ba2Cu4O8 thin films. Journal of Materials Science Letters, 14 (24) 1738-1741 doi:10.1007/bf00270993
Yoon, Y. S., Yom, S. S., Kim, T. W., Kim, H. J., Jung, M., Leem, J. Y., Kang, T. W., Lee, S. J. (1995) Surface, structural and electrical properties of BaTiO3 films grown on p-Si substrates by low pressure metal organic chemical vapour deposition. Journal of Materials Science, 30. 3603-3606 doi:10.1007/bf00351872
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Sung, G. Y., Suh, J. D., Kang, K. Y., Lee, J. Y. (1995) Surface morphology and interface structure of ex situ YBa2Cu3O7?x thin films. Journal of Materials Science Letters, 14 (2) 124-128 doi:10.1007/bf00456565
Woo, Y. D., Lee, H. I., Kang, T. W., Kim, T. W., Wang, K. L. (1995) Reduction of the dislocation density for GaAs thin films on Si substrates grown by molecular beam epitaxy using the two-step growth method. Journal of Materials Science Letters, 14 (19) 1340-1343 doi:10.1007/bf00270721
Yang, H. H., Je, J. H., Lee, K. -B. (1995) Effect of the nitrogen partial pressure on the preferred orientation of TiN thin films. Journal of Materials Science Letters, 14 (23) 1635-1637 doi:10.1007/bf00422660
Leem, J. Y., Son, J. S., Lee, C. R., Kim, C. S., Cho, Y. K., Lee, Hwack J., Noh, S. K., Bae, I. H. (1997) Annealing effects in ZnSe/GaAs heterostructure grown by molecular beam epitaxy. Applied Physics Letters, 71 (22). 3257-3259 doi:10.1063/1.120307
Tu, Y. L., Milne, S. J. (1995) The influence of sol synthesis conditions on the electrical properties of Pb(Zr, Ti)O3 thin films. Journal of Materials Science Letters, 14 (12) 885-888 doi:10.1007/bf00639315
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