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Kwak, J. S., Kim, H. N., Baik, H. K., Shin, D. W., Park, C. G., Kim, C. S., Noh, S. K. (1995) Interfacial reactions of Si/Co films on GaAs. Journal of Materials Science Letters, 14 (6) 408-410 doi:10.1007/bf00274555

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Reference TypeJournal (article/letter/editorial)
TitleInterfacial reactions of Si/Co films on GaAs
JournalJournal of Materials Science Letters
AuthorsKwak, J. S.Author
Kim, H. N.Author
Baik, H. K.Author
Shin, D. W.Author
Park, C. G.Author
Kim, C. S.Author
Noh, S. K.Author
Year1995 (January)Volume14
Issue6
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00274555Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16415054Long-form Identifiermindat:1:5:16415054:6
GUID0
Full ReferenceKwak, J. S., Kim, H. N., Baik, H. K., Shin, D. W., Park, C. G., Kim, C. S., Noh, S. K. (1995) Interfacial reactions of Si/Co films on GaAs. Journal of Materials Science Letters, 14 (6) 408-410 doi:10.1007/bf00274555
Plain TextKwak, J. S., Kim, H. N., Baik, H. K., Shin, D. W., Park, C. G., Kim, C. S., Noh, S. K. (1995) Interfacial reactions of Si/Co films on GaAs. Journal of Materials Science Letters, 14 (6) 408-410 doi:10.1007/bf00274555
In(1995, January) Journal of Materials Science Letters Vol. 14 (6) Springer Science and Business Media LLC

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Kwak, J. S., Kim, H. N., Baik, H. K., Lee, J.‐L., Shin, D. W., Park, C. G., Kim, H., Pyun, K.‐E. (1996) Microstructural and electrical investigations of Pd/Ge/Ti/Au ohmic contact ton‐type GaAs. Journal of Applied Physics, 80 (7). 3904-3909 doi:10.1063/1.363347
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