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OKAMOTO, Yoshihiro, NAKADA, Masami, AKABORI, Mitsuo, KOMAMINE, Satoshi, FUKUI, Toshiki, OCHI, Eiji, NITANI, Hiroaki, NOMURA, Masaharu (2013) High-temperature X-ray Imaging Study of Simulated High-level Waste Glass Melt. Electrochemistry, 81 (7) 543-546 doi:10.5796/electrochemistry.81.543

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Reference TypeJournal (article/letter/editorial)
TitleHigh-temperature X-ray Imaging Study of Simulated High-level Waste Glass Melt
JournalElectrochemistry
AuthorsOKAMOTO, YoshihiroAuthor
NAKADA, MasamiAuthor
AKABORI, MitsuoAuthor
KOMAMINE, SatoshiAuthor
FUKUI, ToshikiAuthor
OCHI, EijiAuthor
NITANI, HiroakiAuthor
NOMURA, MasaharuAuthor
Year2013Volume81
Issue7
PublisherThe Electrochemical Society of Japan
DOIdoi:10.5796/electrochemistry.81.543Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16507005Long-form Identifiermindat:1:5:16507005:8
GUID0
Full ReferenceOKAMOTO, Yoshihiro, NAKADA, Masami, AKABORI, Mitsuo, KOMAMINE, Satoshi, FUKUI, Toshiki, OCHI, Eiji, NITANI, Hiroaki, NOMURA, Masaharu (2013) High-temperature X-ray Imaging Study of Simulated High-level Waste Glass Melt. Electrochemistry, 81 (7) 543-546 doi:10.5796/electrochemistry.81.543
Plain TextOKAMOTO, Yoshihiro, NAKADA, Masami, AKABORI, Mitsuo, KOMAMINE, Satoshi, FUKUI, Toshiki, OCHI, Eiji, NITANI, Hiroaki, NOMURA, Masaharu (2013) High-temperature X-ray Imaging Study of Simulated High-level Waste Glass Melt. Electrochemistry, 81 (7) 543-546 doi:10.5796/electrochemistry.81.543
In(2013) Electrochemistry Vol. 81 (7) The Electrochemical Society of Japan

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Okamoto, Yoshihiro, Shiwaku, Hideaki, Nakada, Masami, Komamine, Satoshi, Ochi, Eiji, Akabori, Mitsuo (2016) REDOX state analysis of platinoid elements in simulated high-level radioactive waste glass by synchrotron radiation based EXAFS. Journal of Nuclear Materials, 471. 110-115 doi:10.1016/j.jnucmat.2016.01.008
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SUGAWARA, Toru, OHIRA, Toshiaki, KOMAMINE, Satoshi, OCHI, Eiji (2016) Estimation of Redox Condition of Simulated High-level Waste Glass Based on the Chemical Composition of Crystalline Phases of Platinum-group Elements. Transactions of the Atomic Energy Society of Japan, 15 (1) 43-52 doi:10.3327/taesj.j15.007
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WATANABE, Sou, OKAMOTO, Yoshihiro, MINATO, Kazuo, AKATSUKA, Hiroshi, MATSUURA, Haruaki (2005) XAFS Analysis of SrF<sub>2</sub> at High Temperature. Electrochemistry, 73 (8) 617-619 doi:10.5796/electrochemistry.73.617
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