Reference Type | Journal (article/letter/editorial) |
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Title | Modeling the Copper Electrodeposition of Through-silicon-vias Corresponded to Linear Sweep Voltammetry |
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Journal | Electrochemistry |
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Authors | LUO, Wei | Author |
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ZHANG, Junhong | Author |
CHEN, Zhipeng | Author |
ZHU, Ying | Author |
GAO, Liming | Author |
LI, Ming | Author |
Year | 2016 | Volume | 84 |
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Issue | 7 |
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Publisher | The Electrochemical Society of Japan |
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DOI | doi:10.5796/electrochemistry.84.516Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 16507687 | Long-form Identifier | mindat:1:5:16507687:6 |
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GUID | 0 |
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Full Reference | LUO, Wei, ZHANG, Junhong, CHEN, Zhipeng, ZHU, Ying, GAO, Liming, LI, Ming (2016) Modeling the Copper Electrodeposition of Through-silicon-vias Corresponded to Linear Sweep Voltammetry. Electrochemistry, 84 (7) 516-522 doi:10.5796/electrochemistry.84.516 |
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Plain Text | LUO, Wei, ZHANG, Junhong, CHEN, Zhipeng, ZHU, Ying, GAO, Liming, LI, Ming (2016) Modeling the Copper Electrodeposition of Through-silicon-vias Corresponded to Linear Sweep Voltammetry. Electrochemistry, 84 (7) 516-522 doi:10.5796/electrochemistry.84.516 |
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In | (2016) Electrochemistry Vol. 84 (7) The Electrochemical Society of Japan |
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