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Hauwiller, Matthew R, Mann, Charlie, Mach, Peter, Terry, Karen, Kautzky, Mike (2023) SEM Grain Characterization of Metals for Nanoelectronics. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 109-110 doi:10.1093/micmic/ozad067.047

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Reference TypeJournal (article/letter/editorial)
TitleSEM Grain Characterization of Metals for Nanoelectronics
JournalMicroscopy and Microanalysis
AuthorsHauwiller, Matthew RAuthor
Mann, CharlieAuthor
Mach, PeterAuthor
Terry, KarenAuthor
Kautzky, MikeAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.047Search in ResearchGate
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Mindat Ref. ID16636737Long-form Identifiermindat:1:5:16636737:9
GUID0
Full ReferenceHauwiller, Matthew R, Mann, Charlie, Mach, Peter, Terry, Karen, Kautzky, Mike (2023) SEM Grain Characterization of Metals for Nanoelectronics. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 109-110 doi:10.1093/micmic/ozad067.047
Plain TextHauwiller, Matthew R, Mann, Charlie, Mach, Peter, Terry, Karen, Kautzky, Mike (2023) SEM Grain Characterization of Metals for Nanoelectronics. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 109-110 doi:10.1093/micmic/ozad067.047
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Klie, Robert F (2023) Analytical Characterization of Functional Materials using Cryo-FIB/SEM and Aberration-corrected Cryo-STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1702-1703 doi:10.1093/micmic/ozad067.877
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