Reference Type | Journal (article/letter/editorial) |
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Title | Electronic properties of polycrystalline LaFeO. Part II: Defect modelling including Schottky defects |
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Journal | Solid State Ionics |
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Authors | WARNHUS, I | Author |
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GRANDE, T | Author |
WIIK, K | Author |
Year | 2005 (November 15) | Volume | 176 |
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Issue | 35 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/j.ssi.2005.07.014Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 16822012 | Long-form Identifier | mindat:1:5:16822012:2 |
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GUID | 0 |
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Full Reference | WARNHUS, I, GRANDE, T, WIIK, K (2005) Electronic properties of polycrystalline LaFeO. Part II: Defect modelling including Schottky defects. Solid State Ionics, 176 (35) 2609-2616 doi:10.1016/j.ssi.2005.07.014 |
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Plain Text | WARNHUS, I, GRANDE, T, WIIK, K (2005) Electronic properties of polycrystalline LaFeO. Part II: Defect modelling including Schottky defects. Solid State Ionics, 176 (35) 2609-2616 doi:10.1016/j.ssi.2005.07.014 |
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In | (2005, November) Solid State Ionics Vol. 176 (35) Elsevier BV |
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