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BURGELMAN, M, NOLLET, P (2005) Admittance spectroscopy of thin film solar cells. Solid State Ionics, 176 (25) 2171-2175 doi:10.1016/j.ssi.2004.08.048

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Reference TypeJournal (article/letter/editorial)
TitleAdmittance spectroscopy of thin film solar cells
JournalSolid State Ionics
AuthorsBURGELMAN, MAuthor
NOLLET, PAuthor
Year2005 (August 15)Volume176
Issue25
PublisherElsevier BV
DOIdoi:10.1016/j.ssi.2004.08.048Search in ResearchGate
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Mindat Ref. ID16822107Long-form Identifiermindat:1:5:16822107:5
GUID0
Full ReferenceBURGELMAN, M, NOLLET, P (2005) Admittance spectroscopy of thin film solar cells. Solid State Ionics, 176 (25) 2171-2175 doi:10.1016/j.ssi.2004.08.048
Plain TextBURGELMAN, M, NOLLET, P (2005) Admittance spectroscopy of thin film solar cells. Solid State Ionics, 176 (25) 2171-2175 doi:10.1016/j.ssi.2004.08.048
In(2005, August) Solid State Ionics Vol. 176 (25) Elsevier BV

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