Nyenge, R.L., Shaat, S.K.K., Noto, L.L., Mokoena, P.P., Swart, H.C., Ntwaeaborwa, O.M. (2015) TOF SIMS analysis, structure and photoluminescence properties of pulsed laser deposited CaS:Eu2+ thin films. Journal of Luminescence, 167. 172-178 doi:10.1016/j.jlumin.2015.06.008
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | TOF SIMS analysis, structure and photoluminescence properties of pulsed laser deposited CaS:Eu2+ thin films | ||
Journal | Journal of Luminescence | ||
Authors | Nyenge, R.L. | Author | |
Shaat, S.K.K. | Author | ||
Noto, L.L. | Author | ||
Mokoena, P.P. | Author | ||
Swart, H.C. | Author | ||
Ntwaeaborwa, O.M. | Author | ||
Year | 2015 (November) | Volume | 167 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.jlumin.2015.06.008Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 16840229 | Long-form Identifier | mindat:1:5:16840229:0 |
GUID | 0 | ||
Full Reference | Nyenge, R.L., Shaat, S.K.K., Noto, L.L., Mokoena, P.P., Swart, H.C., Ntwaeaborwa, O.M. (2015) TOF SIMS analysis, structure and photoluminescence properties of pulsed laser deposited CaS:Eu2+ thin films. Journal of Luminescence, 167. 172-178 doi:10.1016/j.jlumin.2015.06.008 | ||
Plain Text | Nyenge, R.L., Shaat, S.K.K., Noto, L.L., Mokoena, P.P., Swart, H.C., Ntwaeaborwa, O.M. (2015) TOF SIMS analysis, structure and photoluminescence properties of pulsed laser deposited CaS:Eu2+ thin films. Journal of Luminescence, 167. 172-178 doi:10.1016/j.jlumin.2015.06.008 | ||
In | (2015) Journal of Luminescence Vol. 167. Elsevier BV |
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