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Somakumar, Ajeesh Kumar (2023) Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach. Journal of Applied Spectroscopy, 90 (5) 1092-1096 doi:10.1007/s10812-023-01637-0

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Reference TypeJournal (article/letter/editorial)
TitleVariation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach
JournalJournal of Applied Spectroscopy
AuthorsSomakumar, Ajeesh KumarAuthor
Year2023 (November)Volume90
Issue5
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s10812-023-01637-0Search in ResearchGate
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Mindat Ref. ID17001567Long-form Identifiermindat:1:5:17001567:9
GUID0
Full ReferenceSomakumar, Ajeesh Kumar (2023) Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach. Journal of Applied Spectroscopy, 90 (5) 1092-1096 doi:10.1007/s10812-023-01637-0
Plain TextSomakumar, Ajeesh Kumar (2023) Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach. Journal of Applied Spectroscopy, 90 (5) 1092-1096 doi:10.1007/s10812-023-01637-0
In(2023, November) Journal of Applied Spectroscopy Vol. 90 (5) Springer Science and Business Media LLC

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Coşkun, Emre, Sel, Kıvanç, Özder, Serhat, Kurt, Mustafa (2008) Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method. Applied Optics, 47. 4888pp. doi:10.1364/ao.47.004888
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