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Zhang, Jie, He, Xuanhua, Yan, Keyu, Cao, Ke, Li, Rui, Xie, Chengjun, Zhou, Man, Hong, Danfeng (2024) Pan-Sharpening With Wavelet-Enhanced High-Frequency Information. IEEE Transactions on Geoscience and Remote Sensing, 62. 1-14 doi:10.1109/tgrs.2024.3367165

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Reference TypeJournal (article/letter/editorial)
TitlePan-Sharpening With Wavelet-Enhanced High-Frequency Information
JournalIEEE Transactions on Geoscience and Remote Sensing
AuthorsZhang, JieAuthor
He, XuanhuaAuthor
Yan, KeyuAuthor
Cao, KeAuthor
Li, RuiAuthor
Xie, ChengjunAuthor
Zhou, ManAuthor
Hong, DanfengAuthor
Year2024Volume62
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/tgrs.2024.3367165Search in ResearchGate
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Mindat Ref. ID17200511Long-form Identifiermindat:1:5:17200511:1
GUID0
Full ReferenceZhang, Jie, He, Xuanhua, Yan, Keyu, Cao, Ke, Li, Rui, Xie, Chengjun, Zhou, Man, Hong, Danfeng (2024) Pan-Sharpening With Wavelet-Enhanced High-Frequency Information. IEEE Transactions on Geoscience and Remote Sensing, 62. 1-14 doi:10.1109/tgrs.2024.3367165
Plain TextZhang, Jie, He, Xuanhua, Yan, Keyu, Cao, Ke, Li, Rui, Xie, Chengjun, Zhou, Man, Hong, Danfeng (2024) Pan-Sharpening With Wavelet-Enhanced High-Frequency Information. IEEE Transactions on Geoscience and Remote Sensing, 62. 1-14 doi:10.1109/tgrs.2024.3367165
In(2024) IEEE Transactions on Geoscience and Remote Sensing Vol. 62. Institute of Electrical and Electronics Engineers (IEEE)


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