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Sun, Xuanqi, Tang, Enling, Han, Yafei, Chen, Chuang, Chang, Mengzhou, Guo, Kai, He, Liping (2024) Damage characteristic of electronic devices caused by products generated by Al/Ep/KMnO4/TiH2 active material projectile hypervelocity impacting on aluminum target. International Journal of Impact Engineering, 191. 104996 doi:10.1016/j.ijimpeng.2024.104996

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Reference TypeJournal (article/letter/editorial)
TitleDamage characteristic of electronic devices caused by products generated by Al/Ep/KMnO4/TiH2 active material projectile hypervelocity impacting on aluminum target
JournalInternational Journal of Impact Engineering
AuthorsSun, XuanqiAuthor
Tang, EnlingAuthor
Han, YafeiAuthor
Chen, ChuangAuthor
Chang, MengzhouAuthor
Guo, KaiAuthor
He, LipingAuthor
Year2024 (September)Volume191
PublisherElsevier BV
DOIdoi:10.1016/j.ijimpeng.2024.104996Search in ResearchGate
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Mindat Ref. ID17385944Long-form Identifiermindat:1:5:17385944:7
GUID0
Full ReferenceSun, Xuanqi, Tang, Enling, Han, Yafei, Chen, Chuang, Chang, Mengzhou, Guo, Kai, He, Liping (2024) Damage characteristic of electronic devices caused by products generated by Al/Ep/KMnO4/TiH2 active material projectile hypervelocity impacting on aluminum target. International Journal of Impact Engineering, 191. 104996 doi:10.1016/j.ijimpeng.2024.104996
Plain TextSun, Xuanqi, Tang, Enling, Han, Yafei, Chen, Chuang, Chang, Mengzhou, Guo, Kai, He, Liping (2024) Damage characteristic of electronic devices caused by products generated by Al/Ep/KMnO4/TiH2 active material projectile hypervelocity impacting on aluminum target. International Journal of Impact Engineering, 191. 104996 doi:10.1016/j.ijimpeng.2024.104996
In(2024) International Journal of Impact Engineering Vol. 191. Elsevier BV


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