Sun, Xuanqi, Tang, Enling, Han, Yafei, Chen, Chuang, Chang, Mengzhou, Guo, Kai, He, Liping (2024) Damage characteristic of electronic devices caused by products generated by Al/Ep/KMnO4/TiH2 active material projectile hypervelocity impacting on aluminum target. International Journal of Impact Engineering, 191. 104996 doi:10.1016/j.ijimpeng.2024.104996
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Damage characteristic of electronic devices caused by products generated by Al/Ep/KMnO4/TiH2 active material projectile hypervelocity impacting on aluminum target | ||
Journal | International Journal of Impact Engineering | ||
Authors | Sun, Xuanqi | Author | |
Tang, Enling | Author | ||
Han, Yafei | Author | ||
Chen, Chuang | Author | ||
Chang, Mengzhou | Author | ||
Guo, Kai | Author | ||
He, Liping | Author | ||
Year | 2024 (September) | Volume | 191 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.ijimpeng.2024.104996Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 17385944 | Long-form Identifier | mindat:1:5:17385944:7 |
GUID | 0 | ||
Full Reference | Sun, Xuanqi, Tang, Enling, Han, Yafei, Chen, Chuang, Chang, Mengzhou, Guo, Kai, He, Liping (2024) Damage characteristic of electronic devices caused by products generated by Al/Ep/KMnO4/TiH2 active material projectile hypervelocity impacting on aluminum target. International Journal of Impact Engineering, 191. 104996 doi:10.1016/j.ijimpeng.2024.104996 | ||
Plain Text | Sun, Xuanqi, Tang, Enling, Han, Yafei, Chen, Chuang, Chang, Mengzhou, Guo, Kai, He, Liping (2024) Damage characteristic of electronic devices caused by products generated by Al/Ep/KMnO4/TiH2 active material projectile hypervelocity impacting on aluminum target. International Journal of Impact Engineering, 191. 104996 doi:10.1016/j.ijimpeng.2024.104996 | ||
In | (2024) International Journal of Impact Engineering Vol. 191. Elsevier BV |
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