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Hattori, T., Kobayashi, H., Ohtake, H., Akinaga, K., Kurosaki, Y., Takei, A., Sekiguchi, A., Maeda, K., Takubo, C., Yamada, M. (2024) Etching selectivity of SiO2 to SiN using HF and methanol at higher pressures up to 900 Pa. Japanese Journal of Applied Physics, 63 (6) 6 doi:10.35848/1347-4065/ad3fc7

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Reference TypeJournal (article/letter/editorial)
TitleEtching selectivity of SiO2 to SiN using HF and methanol at higher pressures up to 900 Pa
JournalJapanese Journal of Applied Physics
AuthorsHattori, T.Author
Kobayashi, H.Author
Ohtake, H.Author
Akinaga, K.Author
Kurosaki, Y.Author
Takei, A.Author
Sekiguchi, A.Author
Maeda, K.Author
Takubo, C.Author
Yamada, M.Author
Year2024 (June 3)Volume63
Issue6
PublisherIOP Publishing
DOIdoi:10.35848/1347-4065/ad3fc7Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID17433148Long-form Identifiermindat:1:5:17433148:5
GUID0
Full ReferenceHattori, T., Kobayashi, H., Ohtake, H., Akinaga, K., Kurosaki, Y., Takei, A., Sekiguchi, A., Maeda, K., Takubo, C., Yamada, M. (2024) Etching selectivity of SiO2 to SiN using HF and methanol at higher pressures up to 900 Pa. Japanese Journal of Applied Physics, 63 (6) 6 doi:10.35848/1347-4065/ad3fc7
Plain TextHattori, T., Kobayashi, H., Ohtake, H., Akinaga, K., Kurosaki, Y., Takei, A., Sekiguchi, A., Maeda, K., Takubo, C., Yamada, M. (2024) Etching selectivity of SiO2 to SiN using HF and methanol at higher pressures up to 900 Pa. Japanese Journal of Applied Physics, 63 (6) 6 doi:10.35848/1347-4065/ad3fc7
In(2024, June) Japanese Journal of Applied Physics Vol. 63 (6) Japan Society of Applied Physics


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