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Liu, Huan, Feng, Ze, Yu, Fei, Jin, Chengji, Chen, Jiajia, Yu, Xiao, Dong, Hong, Liu, Yan, Han, Genquan (2024) Physical Origin of the Ferroelectric-Type Hysteresis in MIM Structures with Amorphous Dielectric Film. ACS Applied Materials & Interfaces, 16 (44). doi:10.1021/acsami.3c17399

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Reference TypeJournal (article/letter/editorial)
TitlePhysical Origin of the Ferroelectric-Type Hysteresis in MIM Structures with Amorphous Dielectric Film
JournalACS Applied Materials & Interfaces
AuthorsLiu, HuanAuthor
Feng, ZeAuthor
Yu, FeiAuthor
Jin, ChengjiAuthor
Chen, JiajiaAuthor
Yu, XiaoAuthor
Dong, HongAuthor
Liu, YanAuthor
Han, GenquanAuthor
Year2024 (November 6)Volume16
Issue44
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/acsami.3c17399Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID17694530Long-form Identifiermindat:1:5:17694530:7
GUID0
Full ReferenceLiu, Huan, Feng, Ze, Yu, Fei, Jin, Chengji, Chen, Jiajia, Yu, Xiao, Dong, Hong, Liu, Yan, Han, Genquan (2024) Physical Origin of the Ferroelectric-Type Hysteresis in MIM Structures with Amorphous Dielectric Film. ACS Applied Materials & Interfaces, 16 (44). doi:10.1021/acsami.3c17399
Plain TextLiu, Huan, Feng, Ze, Yu, Fei, Jin, Chengji, Chen, Jiajia, Yu, Xiao, Dong, Hong, Liu, Yan, Han, Genquan (2024) Physical Origin of the Ferroelectric-Type Hysteresis in MIM Structures with Amorphous Dielectric Film. ACS Applied Materials & Interfaces, 16 (44). doi:10.1021/acsami.3c17399
In(2024, November) ACS Applied Materials & Interfaces Vol. 16 (44). American Chemical Society (ACS)

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