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Mitsui, Y. (1970) General method of obtaining best helical parameters from the diffraction pattern. Acta Crystallographica Section A, 26 (6) 658-662 doi:10.1107/s0567739470001614

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Reference TypeJournal (article/letter/editorial)
TitleGeneral method of obtaining best helical parameters from the diffraction pattern
JournalActa Crystallographica Section A
AuthorsMitsui, Y.Author
Year1970 (November 1)Volume26
Issue6
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0567739470001614Search in ResearchGate
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Mindat Ref. ID183134Long-form Identifiermindat:1:5:183134:8
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Full ReferenceMitsui, Y. (1970) General method of obtaining best helical parameters from the diffraction pattern. Acta Crystallographica Section A, 26 (6) 658-662 doi:10.1107/s0567739470001614
Plain TextMitsui, Y. (1970) General method of obtaining best helical parameters from the diffraction pattern. Acta Crystallographica Section A, 26 (6) 658-662 doi:10.1107/s0567739470001614
In(1970, November) Acta Crystallographica Section A Vol. 26 (6) International Union of Crystallography (IUCr)

See Also

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Mitsui, Y. (1966) The correlation between helical parameters and layer line distribution in the diffraction pattern of helical polymers. Acta Crystallographica, 20 (5) 694-697 doi:10.1107/s0365110x66001622
Sikka, S. K. (1970) Application of the symbolic addition procedure in neutron diffraction for non-centrosymmetric crystals. Acta Crystallographica Section A, 26 (6) 662-666 doi:10.1107/s0567739470001626
Hebert, H. (1978) A simple method for obtaining triclinic cell parameters from Weissenberg photographs from one crystal setting. Acta Crystallographica Section A, 34 (6) 946-949 doi:10.1107/s056773947800193x
Pathak, P. D., Vasavada, N. G. (1970) Thermal expansion of NaCl, KCl and CsBr by X-ray diffraction and the law of corresponding states. Acta Crystallographica Section A, 26 (6) 655-658 doi:10.1107/s0567739470001602
Blundell, D. J. (1970) One-dimensional models for small-angle X-ray diffraction from crystalline polymers. I. General model. Acta Crystallographica Section A, 26 (5) 472-476 doi:10.1107/s0567739470001250
Iwasaki, H. (1972) On the diffraction enhancement of symmetry. Erratum. Acta Crystallographica Section A, 28 (6) 658 doi:10.1107/s0567739472001640
Nakai, Y. (1970) Excess and defect Kikuchi bands in electron diffraction patterns. Acta Crystallographica Section A, 26 (4) 459-460 doi:10.1107/s0567739470001195
(1970) Notes and News. Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry, 26 (5) 658 doi:10.1107/s0567740870002959
La Fleur, P. L. (1970) The temperature dependence of X-ray diffraction intensities of crystals. Acta Crystallographica Section A, 26 (6) 674-678 doi:10.1107/s056773947000164x
Makowski, L. (1991) An estimate of the number of structural parameters measurable from a fiber diffraction pattern. Acta Crystallographica Section A Foundations of Crystallography, 47 (5). 562-567 doi:10.1107/s0108767391004579
Bortel, Gábor, Tegze, Miklós (2011) Common arc method for diffraction pattern orientation. Acta Crystallographica Section A Foundations of Crystallography, 67 (6). 533-543 doi:10.1107/s0108767311036269
 
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