Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Kumar, Chandra; Kashyap, Vikas; Shrivastav, Monika; Yadav, Jiten; Yadav, Kamlesh; Guzman, Fernando; Saxena, Kapil (2026) Fractal surface roughness effects on CdS/Si Schottky-diodes. Materials Letters, 402. doi:10.1016/j.matlet.2025.139298

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleFractal surface roughness effects on CdS/Si Schottky-diodes
JournalMaterials Letters
AuthorsKumar, ChandraAuthor
Kashyap, VikasAuthor
Shrivastav, MonikaAuthor
Yadav, JitenAuthor
Yadav, KamleshAuthor
Guzman, FernandoAuthor
Saxena, KapilAuthor
Year2026 (January)Volume402
PublisherElsevier BV
DOIdoi:10.1016/j.matlet.2025.139298Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID18849968Long-form Identifiermindat:1:5:18849968:3
GUID0
Full ReferenceKumar, Chandra; Kashyap, Vikas; Shrivastav, Monika; Yadav, Jiten; Yadav, Kamlesh; Guzman, Fernando; Saxena, Kapil (2026) Fractal surface roughness effects on CdS/Si Schottky-diodes. Materials Letters, 402. doi:10.1016/j.matlet.2025.139298
Plain TextKumar, Chandra; Kashyap, Vikas; Shrivastav, Monika; Yadav, Jiten; Yadav, Kamlesh; Guzman, Fernando; Saxena, Kapil (2026) Fractal surface roughness effects on CdS/Si Schottky-diodes. Materials Letters, 402. doi:10.1016/j.matlet.2025.139298
In(2026) Materials Letters Vol. 402. Elsevier BV

References Listed

These are the references the publisher has listed as being connected to the article. Please check the article itself for the full list of references which may differ. Not all references are currently linkable within the Digital Library.

Pathak (2025) Opt. Quant. Electron. 57, 331
Not Yet Imported: - journal-article : 10.1016/j.mssp.2024.108288

If you would like this item imported into the Digital Library, please contact us quoting Journal ID
Najm, A. S., Naeem, Hasanain Salah, Majdi, Hasan Sh., Hasbullah, Siti Aishah, Hasan, Hiba Ali, Sopian, K., Bais, Badariah, Al-Iessa, Heidar J., Dhahad, Hayder A., Ali, Jamal M., Sultan, Abbas J. (2022) An in-depth analysis of nucleation and growth mechanism of CdS thin film synthesized by chemical bath deposition (CBD) technique. Scientific Reports, 12 (1) doi:10.1038/s41598-022-19340-z
Kumar (2024) Colloids Surfaces a: Physicochem Eng. Aspects 691
Milazzo, Simone, Greco, Giuseppe, Di Franco, Salvatore, Fiorenza, Patrick, Giannazzo, Filippo, Bongiorno, Corrado, Gervasi, Leonardo, Mirabella, Salvatore, Iucolano, Ferdinando, Roccaforte, Fabrizio (2025) Tunneling and thermionic emission as charge transport mechanisms in W-based Schottky contacts on AlGaN/GaN heterostructures. Applied Surface Science, 679. doi:10.1016/j.apsusc.2024.161316
Not Yet Imported: - journal-article : 10.1016/j.mssp.2022.106672

If you would like this item imported into the Digital Library, please contact us quoting Journal ID

See Also

These are possibly similar items as determined by title/reference text matching only.

Anjali, , Kumar, Chandra, Redhu, Pooja, Shrivastav, Monika, Kashyap, Vikas, Guzmán, Fernando, Kumar, Sanjeev, Saxena, Kapil (2024) The effect of grain size on diode parameters of Ag/p-NiOx/n-Si/Al based Schottky diode. Materials Letters, 369. 136713 doi:10.1016/j.matlet.2024.136713
Kumar, Chandra, Kashyap, Vikas, Shrivastava, Monika, Guzman, Fernando, Saxena, Kapil (2023) Optimization, design and size effect on the performance of Ag/CdS:Cu/FTO/glass based Schottky diode. Materials Letters, 350. Elsevier BV. 134973 doi:10.1016/j.matlet.2023.134973
Kumar, Chandra, Kashyap, Vikas, Escrig, Juan, Shrivastav, Monika, Kumar, Vivek, Guzman, Fernando, Saxena, Kapil (2024) The dopant (n- and p-type)-, band gap-, size- and stress-dependent field electron emission of silicon nanowires. Physical Chemistry Chemical Physics, 26 (25) 17609-17621 doi:10.1039/d4cp00825a
Kumar, Chandra; Shrivastav, Monika; Escrig, Juan; Ţălu, Ştefan; Yadav, Ram Pratap; Guzman, Fernando (2025) Unravelling the impact of surface roughness and cationic Ni2+ vacancies to Ni3+ ions ratio on optical properties of NiOx thin film: Insights fractal and multi-fractal dimension. Ceramics International, 51 (12). doi:10.1016/j.ceramint.2025.01.362
Kashyap, Vikas, Kumar, Chandra, Chaudhary, Neeru, Saxena, Kapil (2022) The role of quantum crystal radius on electron field emission properties of fractal silicon nanowire arrays. Materials Letters, 314. 131842pp. doi:10.1016/j.matlet.2022.131842
Kashyap, Vikas, Kumar, Chandra, Chaudhary, Neeru, Goyal, Navdeep, Saxena, Kapil (2021) The correlation of resistivity with the crystal size present in silicon nanowires through confinement based models. Materials Letters, 301. 130312pp. doi:10.1016/j.matlet.2021.130312
Kumar, Mahendra, Kumar, Chandra, Saxena, Deepti, Pratap Singh, Dinesh, Kumar Sharma, Sachin, Saxena, Kapil (2023) Design construction and performance of nanostructured p-Cu2S/n-CdS junction diode. Materials Letters, 333. 133650 doi:10.1016/j.matlet.2022.133650
Kumar, Chandra, Shrivastav, Monika, Escrig, Juan, Luis Palma, Juan, Yadav, R.P., Silva, Héctor, Zarate, Antonio (2024) The correlation between surface scaling behavior and optical properties of NiO thin films nanostructures: An investigation based on fractal concepts. Ceramics International, 50 (21). doi:10.1016/j.ceramint.2024.08.011
Kashyap, Vikas, Kumar, Chandra, Kumar, Vivek, Chaudhary, Neeru, Saxena, Kapil (2022) The effect of dopant on light trapping characteristics in random silicon nanowires for solar cell applications. Physica B: Condensed Matter, 638. 413953 doi:10.1016/j.physb.2022.413953
Kashyap, Vikas, Pawar, Hariom, Sihmar, Isha, Kumar, Chandra, Kumar, Anand, Kumar, Sushil, Chaudhary, Neeru, Goyal, Navdeep, Saxena, Kapil (2024) X-ray analysis of Ag nanoparticles on Si wafer and influence of Ag nanoparticles on Si nanowire-based gas sensor. Applied Physics A, 130 (4) doi:10.1007/s00339-024-07379-w
Kashyap, Vikas, Kumar, Chandra, Kumar, Vivek, Chaudhary, Neeru, Saxena, Kapil (2022) Induced quantum-Fano effect by Raman scattering and its correlation with field emission properties of silicon nanowires. Applied Physics A, 128 (4) doi:10.1007/s00339-022-05415-1
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 29, 2025 08:51:05
Go to top of page