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Freymann, Marie, Freymann, René (1952) The New Method of Studying Lattice Defects in Solids by Debye Absorption: Case of Semiconductors. The Journal of Chemical Physics, 20 (12) 1970-1971 doi:10.1063/1.1700354

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Reference TypeJournal (article/letter/editorial)
TitleThe New Method of Studying Lattice Defects in Solids by Debye Absorption: Case of Semiconductors
JournalThe Journal of Chemical Physics
AuthorsFreymann, MarieAuthor
Freymann, RenéAuthor
Year1952 (December)Volume20
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.1700354
Generate Citation Formats
Mindat Ref. ID2004659Long-form Identifiermindat:1:5:2004659:0
GUID0
Full ReferenceFreymann, Marie, Freymann, René (1952) The New Method of Studying Lattice Defects in Solids by Debye Absorption: Case of Semiconductors. The Journal of Chemical Physics, 20 (12) 1970-1971 doi:10.1063/1.1700354
Plain TextFreymann, Marie, Freymann, René (1952) The New Method of Studying Lattice Defects in Solids by Debye Absorption: Case of Semiconductors. The Journal of Chemical Physics, 20 (12) 1970-1971 doi:10.1063/1.1700354
In(1952, December) The Journal of Chemical Physics Vol. 20 (12) AIP Publishing


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