Reference Type | Journal (article/letter/editorial) |
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Title | Intensity and Line‐Width of the 15‐Micron CO2 Band, Determined by a Curve‐of‐Growth Method |
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Journal | The Journal of Chemical Physics |
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Authors | Kaplan, Lewis D. | Author |
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Eggers, David F. | Author |
Year | 1956 (November) | Volume | 25 |
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Issue | 5 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.1743135 |
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| Generate Citation Formats |
Mindat Ref. ID | 2015144 | Long-form Identifier | mindat:1:5:2015144:9 |
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|
GUID | 0 |
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Full Reference | Kaplan, Lewis D., Eggers, David F. (1956) Intensity and Line‐Width of the 15‐Micron CO2 Band, Determined by a Curve‐of‐Growth Method. The Journal of Chemical Physics, 25 (5) 876-883 doi:10.1063/1.1743135 |
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Plain Text | Kaplan, Lewis D., Eggers, David F. (1956) Intensity and Line‐Width of the 15‐Micron CO2 Band, Determined by a Curve‐of‐Growth Method. The Journal of Chemical Physics, 25 (5) 876-883 doi:10.1063/1.1743135 |
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In | (1956, November) The Journal of Chemical Physics Vol. 25 (5) AIP Publishing |
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