Baur, W. H. (1978) Variation of mean Si–O bond lengths in silicon–oxygen tetrahedra. Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry, 34 (6) 1751-1756 doi:10.1107/s0567740878006640
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Variation of mean Si–O bond lengths in silicon–oxygen tetrahedra | ||
Journal | Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry | ||
Authors | Baur, W. H. | Author | |
Year | 1978 (June 1) | Volume | 34 |
Issue | 6 | ||
Publisher | International Union of Crystallography (IUCr) | ||
DOI | doi:10.1107/s0567740878006640Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 205334 | Long-form Identifier | mindat:1:5:205334:3 |
GUID | 0 | ||
Full Reference | Baur, W. H. (1978) Variation of mean Si–O bond lengths in silicon–oxygen tetrahedra. Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry, 34 (6) 1751-1756 doi:10.1107/s0567740878006640 | ||
Plain Text | Baur, W. H. (1978) Variation of mean Si–O bond lengths in silicon–oxygen tetrahedra. Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry, 34 (6) 1751-1756 doi:10.1107/s0567740878006640 | ||
In | (1978, June) Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry Vol. 34 (6) International Union of Crystallography (IUCr) |
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