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van Spengen, W. Merlijn, Roca, Joan Belles (2013) On the noise limit of stress and temperature measurements with micro-Raman spectroscopy. Journal of Raman Spectroscopy, 44 (7). 1039-1044 doi:10.1002/jrs.4314

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Reference TypeJournal (article/letter/editorial)
TitleOn the noise limit of stress and temperature measurements with micro-Raman spectroscopy
JournalJournal of Raman Spectroscopy
Authorsvan Spengen, W. MerlijnAuthor
Roca, Joan BellesAuthor
Year2013 (July)Volume44
Issue7
PublisherWiley
DOIdoi:10.1002/jrs.4314Search in ResearchGate
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Mindat Ref. ID2435557Long-form Identifiermindat:1:5:2435557:5
GUID0
Full Referencevan Spengen, W. Merlijn, Roca, Joan Belles (2013) On the noise limit of stress and temperature measurements with micro-Raman spectroscopy. Journal of Raman Spectroscopy, 44 (7). 1039-1044 doi:10.1002/jrs.4314
Plain Textvan Spengen, W. Merlijn, Roca, Joan Belles (2013) On the noise limit of stress and temperature measurements with micro-Raman spectroscopy. Journal of Raman Spectroscopy, 44 (7). 1039-1044 doi:10.1002/jrs.4314
In(2013, July) Journal of Raman Spectroscopy Vol. 44 (7) Wiley

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