Lee, M. R., Smith, C. L. (2006) Scanning transmission electron microscopy using a SEM: Applications to mineralogy and petrology. Mineralogical Magazine, 70 (5) 579-590 doi:10.1180/0026461067050351
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Scanning transmission electron microscopy using a SEM: Applications to mineralogy and petrology | ||
| Journal | Mineralogical Magazine | ||
| Authors | Lee, M. R. | Author | |
| Smith, C. L. | Author | ||
| Year | 2006 (October) | Volume | 70 |
| Issue | 5 | ||
| Publisher | Mineralogical Society | ||
| DOI | doi:10.1180/0026461067050351Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 243722 | Long-form Identifier | mindat:1:5:243722:8 |
| GUID | 0 | ||
| Full Reference | Lee, M. R., Smith, C. L. (2006) Scanning transmission electron microscopy using a SEM: Applications to mineralogy and petrology. Mineralogical Magazine, 70 (5) 579-590 doi:10.1180/0026461067050351 | ||
| Plain Text | Lee, M. R., Smith, C. L. (2006) Scanning transmission electron microscopy using a SEM: Applications to mineralogy and petrology. Mineralogical Magazine, 70 (5) 579-590 doi:10.1180/0026461067050351 | ||
| Abstract/Notes | AbstractHigh-resolution imaging of electron-transparent samples using a scanning electron microscope, here termed low voltage (LV) STEM, is a new and valuable technique for studying Earth and planetary materials. The most effective method of LV-STEM imaging uses a pair of electron detectors positioned side-by-side beneath the thin sample. The detector directly underlying the sample forms bright-field images dominated by mass-thickness contrast. Activation of the detector offset from the sample yields dark-field images with a greater component of atomic number contrast. LV-STEM images with significant diffraction contrast can also be obtained, but require careful positioning of the sample relative to the electron detectors. In this study LV-STEM was used successfully to image sub-μm sized kaolinite crystals and tens of nm-sized etch pits on the gold-coated surfaces of weathered feldspar grains. Dark-field LV-STEM was also especially effective for characterizing very fine-scale intergrowths of Mg- and Fe-rich phyllosilicates within uniformly thin samples of the Murchison meteorite prepared using the focused ion beam (FIB) technique. LV-STEM is a quick and easy method for characterizing the morphology and internal structure of mineral and rock samples and may prove to be especially useful in geomicrobiology research. | ||
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