Nzogang, Billy C., Mussi, Alexandre, Cordier, Patrick (2019) Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals. Mineralogical Magazine, 83 (1) 71-79 doi:10.1180/mgm.2018.144
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals | ||
| Journal | Mineralogical Magazine | ||
| Authors | Nzogang, Billy C. | Author | |
| Mussi, Alexandre | Author | ||
| Cordier, Patrick | Author | ||
| Year | 2019 (February) | Volume | 83 |
| Issue | 1 | ||
| Publisher | Mineralogical Society | ||
| DOI | doi:10.1180/mgm.2018.144Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 245105 | Long-form Identifier | mindat:1:5:245105:7 |
| GUID | 0 | ||
| Full Reference | Nzogang, Billy C., Mussi, Alexandre, Cordier, Patrick (2019) Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals. Mineralogical Magazine, 83 (1) 71-79 doi:10.1180/mgm.2018.144 | ||
| Plain Text | Nzogang, Billy C., Mussi, Alexandre, Cordier, Patrick (2019) Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals. Mineralogical Magazine, 83 (1) 71-79 doi:10.1180/mgm.2018.144 | ||
| Abstract/Notes | AbstractWe present an application of scanning electron diffraction for the characterisation of crystal defects in olivine, quartz and phase A (a high pressure hydrated phase). In this mode, which takes advantage of the ASTAR™ module from NanoMEGAS, a slightly convergent probe is scanned over the sample with a short acquisition time (a few tens of ms) and the spot patterns are acquired and stored for further post-processing. Originally, orientation maps were constructed from automatic indexing at each probe location. Here we present another application where images are reconstructed from the intensity of diffraction spots, producing either so-called ‘virtual’ bright- or dark-field images. We show that these images present all the characteristics of contrast (perfect crystal or defects) of conventional transmission electron microscopy images. Data are acquired with a very short time per probe location (a few tens of milliseconds), this technique appears very attractive for the characterisation of beam-sensitive materials. However, as the acquisition is done at a given orientation, fine tuning of the diffraction conditions at a given location for each reflection is not possible. This might present a difficulty for some precise, quantitative contrast analysis. | ||
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