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S. J. B. R., (1982) J. I. Golstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori & E. Lifshin 1981. Scanning Electron Microscopy and X-Ray Microanalysis. xiii + 673 pp., numerous illustrations. New York, London: Plenum. Price U.S. $29.50 (U.S.A.); plus 20% elsewhere. ISBN 0 306 40768 X. Geological Magazine, 119 (6) 637-638 doi:10.1017/s0016756800027199

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Reference TypeJournal (article/letter/editorial)
TitleJ. I. Golstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori & E. Lifshin 1981. Scanning Electron Microscopy and X-Ray Microanalysis. xiii + 673 pp., numerous illustrations. New York, London: Plenum. Price U.S. $29.50 (U.S.A.); plus 20% elsewhere. ISBN 0 306 40768 X.
JournalGeological Magazine
AuthorsS. J. B. R., Author
Year1982 (November)Volume119
Issue6
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s0016756800027199Search in ResearchGate
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Mindat Ref. ID252158Long-form Identifiermindat:1:5:252158:3
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Full ReferenceS. J. B. R., (1982) J. I. Golstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori & E. Lifshin 1981. Scanning Electron Microscopy and X-Ray Microanalysis. xiii + 673 pp., numerous illustrations. New York, London: Plenum. Price U.S. $29.50 (U.S.A.); plus 20% elsewhere. ISBN 0 306 40768 X. Geological Magazine, 119 (6) 637-638 doi:10.1017/s0016756800027199
Plain TextS. J. B. R., (1982) J. I. Golstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori & E. Lifshin 1981. Scanning Electron Microscopy and X-Ray Microanalysis. xiii + 673 pp., numerous illustrations. New York, London: Plenum. Price U.S. $29.50 (U.S.A.); plus 20% elsewhere. ISBN 0 306 40768 X. Geological Magazine, 119 (6) 637-638 doi:10.1017/s0016756800027199
In(1982, November) Geological Magazine Vol. 119 (6) Cambridge University Press (CUP)

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Buckley, Andy (1993) J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, A. D. RomigJr, C. E. Lyman, C. Fiori & E. Lifshin 1992. Scanning Electron Microscopy and X-Ray Microanalysis. A Text for Biologists, Materials Scientists, and Geologists, 2nd ed. xviii + 820 pp. New York, London: Plenum Press. Price US $49.50 (hard covers) ISBN 0 306 44175 6. Geological Magazine, 130 (3) 402-403 doi:10.1017/s0016756800020276
Pearce, R. B. (2003) GOLDSTEIN, J., NEWBURY, D., JOY, D., LYMAN, C., ECHLIN, P., LIFSHIN, E., SAWYER, L. & MICHAEL, J. 2003. Scanning Electron Microscopy and X-Ray Microanalysis, 3rd ed. xix + 689 pp. New York, Boston, Dordrecht, London, Moscow: Kluwer Academic/Plenum Publishers. Price Euros 76.00, US $75.00, £48.00 (hard covers) ISBN 0 306 47292 9. Geological Magazine, 140 (6) 728-729 doi:10.1017/s0016756803238838
Burany, Sandy (2003) Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9. Microscopy and Microanalysis, 9 (5). 484 doi:10.1017/s1431927603030617
J. T., (1982) D. F. Merriam (ed.) 1981. Computer Applications in the Earth Sciences. An update of the 70s. xiv + 385 pp. New York, London: Plenum. Price U.S. $45.00 (U.S.A.); plus 20% elsewhere. ISBN 0 306 40409 0. Geological Magazine, 119 (5) 518 doi:10.1017/s0016756800026935
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A. G., (1982) J. G. Moore (ed.) 1981. Scientific Basis for Nuclear Waste Management. Volume 3. xvii + 632 pp., numerous figs. Proceedings of the Third International Symposium on the Scientific Basis for Nuclear Waste Management, Boston, November 17–20, 1980. New York, London: Plenum. Price U.S. $49.50 (U.S.A.) plus 20% elsewhere. ISBN 0 306 40803 1. Geological Magazine, 119 (3) 327-328 doi:10.1017/s0016756800026182
 
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