Reference Type | Journal (article/letter/editorial) |
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Title | X-ray diffraction studies of CdTe grown on InSb |
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Journal | Journal of Crystal Growth |
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Authors | Bhat, Ishwara B. | Author |
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Patel, Kshyamasil | Author |
Taskar, Nikhil R. | Author |
Ayers, John E. | Author |
Ghandhi, Sorab K. | Author |
Year | 1988 (April) | Volume | 88 |
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Issue | 1 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0022-0248(98)90004-5Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 2780021 | Long-form Identifier | mindat:1:5:2780021:6 |
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GUID | 0 |
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Full Reference | Bhat, Ishwara B., Patel, Kshyamasil, Taskar, Nikhil R., Ayers, John E., Ghandhi, Sorab K. (1988) X-ray diffraction studies of CdTe grown on InSb. Journal of Crystal Growth, 88 (1). 23-29 doi:10.1016/s0022-0248(98)90004-5 |
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Plain Text | Bhat, Ishwara B., Patel, Kshyamasil, Taskar, Nikhil R., Ayers, John E., Ghandhi, Sorab K. (1988) X-ray diffraction studies of CdTe grown on InSb. Journal of Crystal Growth, 88 (1). 23-29 doi:10.1016/s0022-0248(98)90004-5 |
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In | (1988, April) Journal of Crystal Growth Vol. 88 (1) Elsevier BV |
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